Zobrazeno 1 - 10
of 37
pro vyhledávání: '"Yuya Kanitani"'
Autor:
Keito Mori-Tamamura, Yuchi Takahashi, Shigeta Sakai, Yuya Morimoto, Junji Hirama, Atsushi A. Yamaguchi, Susumu Kusanagi, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya
Publikováno v:
Science and Technology of Advanced Materials: Methods, Vol 4, Iss 1 (2024)
ABSTRACTSeparated evaluation of factors in the external quantum efficiency (EQE) is important in order to improve the characteristics of semiconductors optical devices. Especially, the internal quantum efficiency (IQE) is an important value which ind
Externí odkaz:
https://doaj.org/article/e41a71acd27f466ca3477302dd2b395f
Autor:
Shunsuke Yamashita, Sei Fukushima, Jun Kikkawa, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo
Publikováno v:
APL Materials, Vol 12, Iss 3, Pp 031101-031101-8 (2024)
Defects in semiconductor materials significantly impact their inherent properties, making the evaluation of local defects and their energy levels crucial for controlling device performance. With advancements in monochromators, electron energy loss sp
Externí odkaz:
https://doaj.org/article/cef3b4dcaf7945c5998efbb09f8a0802
Autor:
Satoko Toyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata
Publikováno v:
Nature Nanotechnology. 18:521-528
Autor:
Yudai Yamaguchi, Yuya Kanitani, Yoshihiro Kudo, Jun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono, Shigetaka Tomiya
Publikováno v:
Nano Letters. 22:6930-6935
The compositional and structural investigations of threading dislocations (TDs) in InGaN/GaN multiple quantum wells were carried out using correlative transmission electron microscopy (TEM) and atom probe tomography (APT). The correlative TEM/APT ana
Autor:
Tatsushi Hamaguchi, Maiko Ito, Jared A. Kearns, Tomohiro Makino, Kentaro Hayashi, Maho Ohara, Noriko Kobayashi, Tatsuro Jyokawa, Eiji Nakayama, Shouetsu Nagane, Koichi Sato, Yuki Nakamura, Yukio Hoshina, Yuichiro Kikuchi, Takumi Watanabe, Yuya Kanitani, Seiji Kasahara, Yoshihiro Kudo, Susumu Kusanagi, Rintaro Koda, Noriyuki Fuutagawa
Publikováno v:
Gallium Nitride Materials and Devices XVIII.
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 142:367-372
Autor:
Maiko Ito, Tatsushi Hamaguchi, Tomohiro Makino, Kentaro Hayashi, Jared A. Kearns, Maho Ohara, Noriko Kobayashi, Shoetsu Nagane, Koichi Sato, Yuki Nakamura, Yukio Hoshina, Tatsurou Jyoukawa, Takumi Watanabe, Yuichiro Kikuchi, Seiji Kasahara, Susumu Kusanagi, Yuya Kanitani, Yoshihiro Kudo, Eiji Nakayama, Rintaro Koda, Noriyuki Futagawa
Publikováno v:
Applied Physics Express. 16:012006
This study obtained highly uniform and efficient GaN-based vertical-cavity surface-emitting lasers with curved mirrors from a single wafer. The average threshold current (I th) and the optical output power (P max) of 14 chips measured up to 7.0 mA we
Autor:
Jared Kearns, Tatsushi Hamaguchi, Kentaro Hayashi, Maho Ohara, Tomohiro Makino, Maiko Ito, Noriko Kobayashi, Tatsuro Jyokawa, Eiji Nakayama, Shouetsu Nagane, Koichi Sato, Yuki Nakamura, Yukio Hoshina, Yuya Kanitani, Seiji Kasahara, Susumu Kusanagi, Yoshihiro Kudo, Rintaro Koda, Noriyuki Futagawa
Publikováno v:
Gallium Nitride Materials and Devices XVII.
Autor:
Satoko Toyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata
Publikováno v:
Ultramicroscopy. 238
Differential phase contrast (DPC) in scanning transmission electron microscopy can be used to visualize electric field distributions within specimens in real space. However, for electric field mapping in crystalline specimens, the concomitant diffrac
Autor:
Keito Mori, Yuchi Takahashi, Shigeta Sakai, Yuya Morimoto, Atsushi A. Yamaguchi, Susumu Kusanagi, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya
Publikováno v:
2021 27th International Semiconductor Laser Conference (ISLC).