Výsledky vyhledávání - "Yuxuan Cosmi Lin"

Dielectric Material Technologies for 2-D Semiconductor Transistor Scaling

Autor: Yuxuan Cosmi Lin, Cheng-Ming Lin, Hung-Yu Chen, Sam Vaziri, Xinyu Bao, Wei-Yen Woon, Han Wang, Szuya Sandy Liao

Publikováno v: IEEE Transactions on Electron Devices. 70:1454-1473

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::764ffac6919084fbbfe1150d35ddb9aa
https://doi.org/10.1109/ted.2022.3224100

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Ab Initio Computational Screening and Performance Assessment of van der Waals and Semimetallic Contacts to Monolayer WSe2 P-Type Field-Effect Transistors

Autor: Ning Yang, Yuxuan Cosmi Lin, Chih-Piao Chuu, M. Saifur Rahman, Tong Wu, Ang-Sheng Chou, Hung-Yu Chen, Wei-Yen Woon, Szuya Sandy Liao, Shengxi Huang, Xiaofeng Qian, Jing Guo, Iuliana Radu, H.-S. Philip Wong, Han Wang

Publikováno v: IEEE Transactions on Electron Devices. 70:2090-2097

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7969f06a16177b7c0ee2ffea794017cd
https://doi.org/10.1109/ted.2023.3241569

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Computational Screening and Multiscale Simulation of Barrier-Free Contacts for 2D Semiconductor pFETs

Publikováno v: 2022 International Electron Devices Meeting (IEDM).

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a1a6267d71a0b80680f03af12f0f367c
https://doi.org/10.1109/iedm45625.2022.10019377

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High-Performance Monolayer WSe2 p/n FETs via Antimony-Platinum Modulated Contact Technology towards 2D CMOS Electronics

Publikováno v: 2022 International Electron Devices Meeting (IEDM).

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d9467739def02edf3a3e51a87ec0b3f5
https://doi.org/10.1109/iedm45625.2022.10019491

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Wafer-Scale Bi-Assisted Semi-Auto Dry Transfer and Fabrication of High-Performance Monolayer CVD WS2 Transistor

Autor: Ming-Yang Li, Ching-Hao Hsu, Shin-Wei Shen, Ang-Sheng Chou, Yuxuan Cosmi Lin, Chih-Piao Chuu, Ning Yang, Sui-An Chou, Lin-Yun Huang, Chao-Ching Cheng, Wei-Yen Woon, Szuya Liao, Chih-I Wu, Lain-Jong Li, Iuliana Radu, H.-S. Philip Wong, Han Wang

Publikováno v: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::67509489ffaaeb7df65cfbe746a642c6
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830376

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Measuring complex refractive index through deep-learning-enabled optical reflectometry

Autor: Ziyang Wang, Yuxuan Cosmi Lin, Kunyan Zhang, Wenjing Wu, Shengxi Huang

Publikováno v: 2D Materials. 10:025025

Optical spectroscopy is indispensable for research and development in nanoscience and nanotechnology, microelectronics, energy, and advanced manufacturing. Advanced optical spectroscopy tools often require both specifically designed high-end instrume

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::15f61dde21579bd70101c4766030e0ff
https://doi.org/10.1088/2053-1583/acc59b

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