Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Yutaro Iwashige"'
Publikováno v:
Journal of Photopolymer Science and Technology. 35:41-47
Publikováno v:
Japanese Journal of Applied Physics. 62:036502
For the advancement of lithography, the resist materials and processes are the most critical factors. In particular, the process of developing resist materials is important in reducing the line width roughness and stochastic defects. In this study, a