Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Yuta Toriyama"'
Autor:
Dejan Markovic, Yuta Toriyama
Publikováno v:
IEEE Journal of Solid-State Circuits. 53:2378-2388
Non-binary low-density parity-check (NB-LDPC) codes are a promising class of error-correcting codes that provide excellent coding gain beyond that of their binary counterparts. However, their decoding complexity has thus far limited practicality. We
Autor:
Yuta Toriyama, Dejan Markovic
Publikováno v:
2017 Symposium on VLSI Circuits.
This paper presents a Non-Binary LDPC decoder with information throughput of 2.267Gbps and power consumption of 212.4mW, yielding an energy efficiency of 93.7pJ/b, implemented in a 40nm CMOS technology. The employed code is long and high-rate without
Autor:
Dejan Markovic, Chih-Kong Ken Yang, Yuta Toriyama, Fengbo Ren, Richard Dorrance, Amr Amin Hafez
Publikováno v:
IEEE Transactions on Electron Devices. 59:878-887
We present a design-space feasibility region, as a function of magnetic tunnel junction (MTJ) characteristics and target memory specifications, to explore the design margin of a one-transistor-one-magnetic-tunnel-junction (1T-1MTJ) memory cell for sp
Publikováno v:
GLOBECOM
Non-binary low-density parity-check (NB-LDPC) codes exhibit excellent error correction performance at the cost of high computational complexity of the decoding algorithm. A logarithmic quantization scheme is proposed to reduce the VLSI implementation
Publikováno v:
ACSSC
Non-binary low-density parity-check codes exhibit excellent coding gain at the cost of decoding complexity. Furthermore, the effects of the Galois field order on the hardware cost have not been well established. We propose a modification to the Min-M
Publikováno v:
ISQED
With scaling of CMOS and Magnetic Tunnel Junction (MTJ) devices, conventional low-current reading techniques for STT-RAMs face challenges in achieving reliability and performance improvements that are expected from scaled devices. The challenges aris
Publikováno v:
NANOARCH
This paper introduces a design-space feasibility region as a function of MTJ characteristics and memory target specifications. The sensitivity of the design space is analyzed for scaling of both MTJ and underlying transistor technology. Design points