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Autor:
Yusuke Yonaha, Iku Kusajima, Kenta Kuroishi, Yasushiro Nishioka, Toshinari Doi, Satomitsu Imai
Publikováno v:
IEICE Transactions on Electronics. :151-154
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f378aea0b1254677e7edfc700a91d3e8
https://doi.org/10.1587/transele.2018oms0005
https://doi.org/10.1587/transele.2018oms0005
