Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Yushchenko Aleksey"'
Publikováno v:
ITM Web of Conferences, Vol 30, p 04012 (2019)
We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain ph
Externí odkaz:
https://doaj.org/article/e7608fe965c14729ac60dbb8ba7d8ed5
Publikováno v:
ITM Web of Conferences; 2019, Vol. 30, p1-4, 4p