Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Yury Galitsyn"'
Publikováno v:
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).
In this work, using the RHEED technique, the optimal stage of sapphire nitridation completeness was determined taking into account the electron beam influence on a nitridation process. It was found that as a result of the sapphire surface nitridation
Autor:
Vladimir G. Mansurov, Yury Galitsyn, S. A. Teys, D. S. Milakhin, Timur V. Malin, Konstantin Zhuravlev
Publikováno v:
Applied Surface Science. 571:151276
Evolution of atomic and electronic structures during high temperature Si(1 1 1) surface nitridation under ammonia flux was studied in details by the STM/STS techniques. The adsorption and intermediate phases arising at low doses preceding the (8 × 8
Publikováno v:
Journal of Thermal Analysis and Calorimetry. 133:1099-1107
Chemical kinetics of a two-dimensional (2D) AlN layer formation on the (0001) sapphire (Al2O3) surface during nitridation as function of ammonia flux and temperature is investigated by reflection high-energy electron diffraction. The process on the s
Publikováno v:
physica status solidi c. 12:443-446
Kinetics of a two-dimensional (2D) AlN layer formation on (0001) sapphire (Al2O3) surface during nitridation at different ammonia fluxes is investigated by reflection high energy electron diffraction (RHEED). The process on the surface is described i
Publikováno v:
physica status solidi c. 11:613-616
Influence of temperature on AlN formation on (0001) Al2O3 surface under ammonia flux (nitridation process) has been investigated by high-energy electron diffraction. A significant temperature dependence of AlN formation rate in the temperature range
Publikováno v:
physica status solidi (b). 256:1800516
Publikováno v:
2008 9th International Workshop and Tutorials on Electron Devices and Materials.
At the present work 3D nucleation kinetics of GaN on (0001)AlN was experimentally studied. The initial stages of the GaN growth on the flat AlN surface were monitored by a real-time reflection high-energy electron diffraction (RHEED) technique. Expon
Autor:
Sakhno, V. I., Dolgikh, A. V., Chubarev, V. G., Marakhovka, I. I., Yury Galitsyn, Mansurov, V. G., Suranov, A. S.
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7012198008aae9d38978fdaf201491c0
http://www.scopus.com/inward/record.url?eid=2-s2.0-0030353251&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0030353251&partnerID=MN8TOARS
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::eb4c6166f5d936c2dcc188c22c6621bc
http://www.scopus.com/inward/record.url?eid=2-s2.0-0027795097&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0027795097&partnerID=MN8TOARS