Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Yuriy Halahovets"'
Autor:
Farnoush Salehtash, Adriana Annušová, Anastasiia Stepura, Yaryna Soyka, Yuriy Halahovets, Monika Hofbauerová, Matej Mičušík, Mário Kotlár, Peter Nádaždy, Paweł Albrycht, Peter Šiffalovič, Matej Jergel, Mária Omastová, Eva Majková
Publikováno v:
Materials, Vol 17, Iss 6, p 1385 (2024)
The surface-enhanced Raman scattering (SERS) properties of low-dimensional semiconducting MXene nanoflakes have been investigated over the last decade. Despite this fact, the relationship between the surface characteristics and SERSing performance of
Externí odkaz:
https://doaj.org/article/b2043302209d41a99b4a8e0ca662429f
Autor:
Andrii Kozak, Monika Hofbauerová, Yuriy Halahovets, Lenka Pribusová-Slušná, Marián Precner, Matej Mičušík, L’ubomír Orovčík, Martin Hulman, Anastasiia Stepura, Mária Omastová, Peter Šiffalovič, Milan Ťapajna
Publikováno v:
ACS Applied Materials & Interfaces. 14:36815-36824
Autor:
Peter Machata, Monika Hofbauerová, Yaryna Soyka, Anastasiia Stepura, Daniel Truchan, Yuriy Halahovets, Matej Mičušík, Peter Šiffalovič, Eva Majková, Mária Omastová
Publikováno v:
Journal of colloid and interface science. 622
One of the highlighted properties of TiMeasurements of the advancing and receding contact angle on mono-, bi, and trilayer TiThe values of the advancing contact angle on Ti
Autor:
Yuriy Halahovets, Alica Brunova, Matej Jergel, Dmytro Kostiuk, Mário Kotlár, Eva Majkova, Ashin Shaji, Peter Siffalovic, Michal Bodík, Pavel Veis, T. M. Shabelnyk, Maksym Hennadiiovych Demydenko
Publikováno v:
The Journal of Physical Chemistry C. 124:15856-15861
Recent advances in the liquid-phase exfoliation enabled large-scale production of two-dimensional (2D) materials, including few-layer graphene and transition metal dichalcogenides. The exfoliated flakes of 2D materials allow cost-effective deposition
Autor:
Jaroslav Mosnáček, Yuriy Halahovets, Matej Mičušík, Dmytro Kostiuk, Ján Ivančo, Ana Hološ, Monika Benkovičová, Jozef Kollár
Publikováno v:
Ceramics International. 46:15876-15881
The alumina wafer pre-annealed in dry air manifests chemiresistive behaviour: the electrical resistivity is highly sensitive to trace concentrations of acetone vapours even at room temperature. The response suggests that the alumina can be applicable
Autor:
Ashin Shaji, Karol Vegso, Michaela Sojkova, Martin Hulman, Peter Nadazdy, Yuriy Halahovets, Lenka Pribusova Slusna, Tatiana Vojtekova, Jana Hrda, Matej Jergel, Eva Majkova, Joerg Wiesmann, Peter Siffalovic
Publikováno v:
Applied Surface Science. 606:154772
Autor:
Karol Vegso, Ashin Shaji, Michaela Sojková, Lenka Príbusová Slušná, Tatiana Vojteková, Jana Hrdá, Yuriy Halahovets, Martin Hulman, Matej Jergel, Eva Majková, Jörg Wiesmann, Peter Šiffalovič
Publikováno v:
Review of Scientific Instruments. 93:113909
The few-layer transition metal dichalcogenides (TMD) are an attractive class of materials due to their unique and tunable electronic, optical, and chemical properties, controlled by the layer number, crystal orientation, grain size, and morphology. O
Autor:
Matej Mičušík, Ján Ivančo, Dmytro Kostiuk, Jozef Kollár, Ana Hološ, Monika Benkovičová, Jaroslav Mosnáček, Yuriy Halahovets
Publikováno v:
Journal of Electrical Engineering. 70:122-126
The study demonstrates that resistivity of an alumina wafer is highly sensitive to trace concentrations of acetone vapors at room temperature. Though, a thermal pretreatment is necessary to precede the room-temperature sensing of acetone vapors, whil
Autor:
Eva Majkova, Pavel Veis, Peter Siffalovic, Alicia Marín Roldán, Matej Jergel, Mário Kotlár, Maksym Hennadiiovych Demydenko, M. Angus, Dmytro Kostiuk, Michal Bodík, Karol Vegso, Gulab Singh Maurya, Yuriy Halahovets, Anna Kalosi, Jakub Hagara
Publikováno v:
Langmuir. 35:9802-9808
Few-layer MoS2 films stay at the forefront of current research of two-dimensional materials. At present, continuous MoS2 films are prepared by chemical vapor deposition (CVD) techniques. Herein, we present a cost-effective fabrication of the large-ar
Autor:
Eva Majkova, Peter Siffalovic, Jozef Keckes, Zdenko Zápražný, Jakub Hagara, Mário Kotlár, D. Korytár, Igor Maťko, Matej Jergel, Yuriy Halahovets
Publikováno v:
The International Journal of Advanced Manufacturing Technology. 102:2757-2767
Micro-Raman spectroscopy, scanning electron microscopy (SEM), and high-resolution transmission electron microscopy (HR-TEM) were used to study the effect of cutting speed and cutting depth on the mode of the single-point diamond fly cutting of Ge(110