Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Yuri Houk"'
Publikováno v:
Journal of Telecommunications and Information Technology, Iss 1 (2004)
Mechanisms of the charge transfer, the charge trapping, and the generation of positive charge during the high-field electron injection into buried oxide of silicon-on-insulator structures fabricated by different technologies are analyzed based on the
Externí odkaz:
https://doaj.org/article/99b9c110f5fa472ea0fba2ad1919f7dc
Autor:
Yuri Houk
Publikováno v:
Semiconductor Physics, Quantum Electronics & Optoelectronics. 9:43-54
Autor:
Noppen, Jean-Pierre van, Hols, Edith
Metaphor, though not now the scholarly “mania” it once was, remains a topic of great interest in many disciplines albeit with interesting shifts in emphasis. Warren Shibles'Metaphor: An Annotated Bibliography and History (Bloomington, Ind. 1971)