Zobrazeno 1 - 10
of 36
pro vyhledávání: '"Yung-Chen Chen"'
Publikováno v:
Kaohsiung Journal of Medical Sciences, Vol 21, Iss 2, Pp 51-56 (2005)
Field surveys of mosquitoes were carried out on Green, Orchid, and Penghu Islands in 2003 to ascertain the status of mosquito vectors. Eighteen species of mosquitoes were collected, including three species of Anopheles, four species of Aedes, eight s
Externí odkaz:
https://doaj.org/article/7814c024981848baa8135c15f96467d0
Autor:
Yung-Chen Chen, 陳永鎮
97
Among all fraud crimes, money-swindling through communication in the names of civil servants is the worst type and largest money loss of fraud crimes that interfere with the relationship between persons and the trust between public sectors an
Among all fraud crimes, money-swindling through communication in the names of civil servants is the worst type and largest money loss of fraud crimes that interfere with the relationship between persons and the trust between public sectors an
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/36797091661824743629
Autor:
Yung-Chen Chen, 陳永錚
94
Metal oxide films play the role of the buffer-layer and hole-injection layer, and improve the interface roughness problem between organic materials and ITO electrode. They also increase the hole-injection efficiency for more hole-electron to
Metal oxide films play the role of the buffer-layer and hole-injection layer, and improve the interface roughness problem between organic materials and ITO electrode. They also increase the hole-injection efficiency for more hole-electron to
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/89223354957760500066
Autor:
Yung-Chen Chen, 陳勇成
88
The traditional three stage wastewater treatment process is popular for the treatment high-carbon (COD：3800∼10000 mg/l) and high-nitrogen (TKN：240∼580 mg/l) swine wastewater from swine farms. However, so far this process did not effec
The traditional three stage wastewater treatment process is popular for the treatment high-carbon (COD：3800∼10000 mg/l) and high-nitrogen (TKN：240∼580 mg/l) swine wastewater from swine farms. However, so far this process did not effec
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/97553841218916292633
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:1783-1793
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6721139ef2957aeebc26542d02fa1246
https://doi.org/10.1109/tvlsi.2022.3201946
https://doi.org/10.1109/tvlsi.2022.3201946
Autor:
Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:975-988
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca07a3fc293166334a3bd6b04c0053b7
https://doi.org/10.1109/tvlsi.2022.3154535
https://doi.org/10.1109/tvlsi.2022.3154535
Publikováno v:
PDP
Parallel asynchronous stochastic dual coordinate descent algorithm (PASSCoDe) is an efficient method to train linear models in multi-core shared-memory systems. PASSCoDe enjoys a good speedup when the number of threads is less than 8 on sparse datase
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::029ac30bef3b9999e1f5efd975448ca9
https://doi.org/10.1109/pdp52278.2021.00016
https://doi.org/10.1109/pdp52278.2021.00016
Autor:
Mango C.-T. Chao, Yung-Chen Chen, Kai-Chiang Wu, Yi-Lun Tang, Yu-Pang Hu, Ming-Chien Chen, Fu-Sheng Huang, Shuo-Wen Chang, Chi Chun Wang
Publikováno v:
ITC-Asia
A defect-based bridge fault represents the faulty behavior of an interconnect short defect obtained by SPICE-simulating the two shorted cells with the short defect injected. In this paper, we have developed a framework to automatically extract defect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f887306351b4c3d6c0752a5345f042ae
https://doi.org/10.1109/itc-asia51099.2020.00030
https://doi.org/10.1109/itc-asia51099.2020.00030
Publikováno v:
2017 Silicon Nanoelectronics Workshop (SNW).
In this work we study the random telegraph noise (RTN) characteristics of short-channel gate-all-around (GAA) poly-Si junctionless (JL) nanowire (NW) transistors. The test devices were fabricated with I-line-based lithography in combination with nove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37875777136f4b51b9c5545610429359
https://doi.org/10.23919/snw.2017.8242289
https://doi.org/10.23919/snw.2017.8242289
Publikováno v:
2016 IEEE Silicon Nanoelectronics Workshop (SNW).
Short-channel gate-all-around (GAA) poly-Si junctionless (JL) nanowire (NW) transistors were fabricated using the control available through cost-effective I-Line lithographic patterning and spacer techniques. This scheme enables the production of GAA
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8a2a95ffc0da699c694afd35f6fbc2d
https://doi.org/10.1109/snw.2016.7577987
https://doi.org/10.1109/snw.2016.7577987