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pro vyhledávání: '"Yukwang Kim"'
Publikováno v:
Journal of the Korean Physical Society. 77:78-81
We investigate over a period of a 500 hours the effect of relative humidity (RH) on the retention loss in ferroelectric P(VDF-TrFE) thin films by using piezoresponse force microscopy (PFM). When the copolymer films are exposed to more water molecules
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f93770496baccef0276985e10dac8a0
https://doi.org/10.3938/jkps.77.78
https://doi.org/10.3938/jkps.77.78
Publikováno v:
Journal of the Korean Physical Society; Jul2020, Vol. 77 Issue 1, p78-81, 4p