Zobrazeno 1 - 10
of 700
pro vyhledávání: '"Yukio TAKAHASHI"'
Publikováno v:
Journal of Advanced Mechanical Design, Systems, and Manufacturing, Vol 18, Iss 4, Pp JAMDSM0050-JAMDSM0050 (2024)
Low-frequency vibration cutting technology can actively generate an intermittent cutting process in which chips are broken up by vibrating the tool in the feed direction synchronized with the spindle rotation. The sinusoidal oscillation superimposed
Externí odkaz:
https://doaj.org/article/3e25b75ebca048c1bf1ad54b0ada5cd2
Publikováno v:
Theory and Applications of Graphs, Vol 11, Iss 1, Pp 1-11 (2024)
A graph $G$ is called edge-magic if there exists a bijective function $f:V\left(G\right) \cup E\left(G\right)\rightarrow \left\{1, 2, \ldots , \left\vert V\left( G\right) \right\vert +\left\vert E\left(G\right) \right\vert \right\}$ such that $f\left
Externí odkaz:
https://doaj.org/article/dacc7497c5044b8c95eaa33eb20b67b6
Publikováno v:
Nuclear Engineering and Technology, Vol 55, Iss 11, Pp 4146-4158 (2023)
This paper proposes a combined plastic and creep constitutive model of A533B1 pressure vessel steel to simulate progressive deformation of nuclear pressure vessels under severe accident conditions. To develop the model, recent tensile test data cover
Externí odkaz:
https://doaj.org/article/726d79f802d84627a2352a84de709526
Publikováno v:
Nuclear Engineering and Technology, Vol 55, Iss 11, Pp 4134-4145 (2023)
This paper proposes strain-based failure model of A533B1 pressure vessel steel to simulate failure, followed by application to OECD lower head failure (OLHF) test simulation for experimental validation. The proposed strain-based failure model uses si
Externí odkaz:
https://doaj.org/article/92154ed2de0c48ed9908f2f477acc521
Autor:
Yukio Takahashi, Masaki Abe, Hideshi Uematsu, Shuntaro Takazawa, Yuhei Sasaki, Nozomu Ishiguro, Kyosuke Ozaki, Yoshiaki Honjo, Haruki Nishino, Kazuo Kobayashi, Toshiyuki Nishiyama Hiraki, Yasumasa Joti, Takaki Hatsui
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 5, Pp 989-994 (2023)
Ptychographic coherent diffraction imaging (PCDI) is a synchrotron X-ray microscopy technique that provides high spatial resolution and a wide field of view. To improve the performance of PCDI, the performance of the synchrotron radiation source and
Externí odkaz:
https://doaj.org/article/aa6db4eec9dc4067a952ea1685636fc6
Publikováno v:
Contributions to Mathematics, Vol 8, Pp 11-15 (2023)
Externí odkaz:
https://doaj.org/article/37e6d3e3052944df9e52b372db93f5c6
Publikováno v:
Mechanical Engineering Journal, Vol 11, Iss 1, Pp 23-00491-23-00491 (2024)
Buckling is a critical failure mode of the Fast Reactor Main Vessel (FRMV) subjected to seismic load. Post-buckling stability of FRMV is a crucial safety issue during excessive earthquakes. Our prior study revealed that global response becomes stable
Externí odkaz:
https://doaj.org/article/b233f6fcd106434490caed28cbfce99d
Publikováno v:
Discrete Mathematics Letters, Vol 12, Pp 22-25 (2023)
Externí odkaz:
https://doaj.org/article/3f899ac3f13647e495de189312fda2e3
Autor:
Shuntaro Takazawa, Duc-Anh Dao, Masaki Abe, Hideshi Uematsu, Nozomu Ishiguro, Taiki Hoshino, Hieu Chi Dam, Yukio Takahashi
Publikováno v:
Physical Review Research, Vol 5, Iss 4, p L042019 (2023)
Two well-known measurement methods use coherent x rays: x-ray photon correlation spectroscopy (XPCS) and coherent x-ray diffraction imaging (CXDI). We propose and demonstrate an approach to analyze particle motion in heterogeneous solutions over a wi
Externí odkaz:
https://doaj.org/article/7d9f87f549f64fc789bc21004328ae69
Autor:
Nozomu Ishiguro, Fusae Kaneko, Masaki Abe, Yuki Takayama, Junya Yoshida, Taiki Hoshino, Shuntaro Takazawa, Hideshi Uematsu, Yuhei Sasaki, Naru Okawa, Keichi Takahashi, Hiroyuki Takizawa, Hiroyuki Kishimoto, Yukio Takahashi
Publikováno v:
Applied Physics Express, Vol 17, Iss 5, p 052006 (2024)
As the first experiment at BL10U in NanoTerasu, tender X-ray ptychographic coherent diffraction imaging (PCDI) was conducted using a photon energy of 3.5 keV. The ptychographic diffraction patterns from a 200 nm thick Ta test chart and a micrometer-s
Externí odkaz:
https://doaj.org/article/23f2876cccc24d48b795e637d8587189