Zobrazeno 1 - 10
of 152
pro vyhledávání: '"Yuji Muramoto"'
Publikováno v:
2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::defdf3b15108e204a9169dec50bc7fc6
https://doi.org/10.1109/ceidp55452.2022.9985306
https://doi.org/10.1109/ceidp55452.2022.9985306
Publikováno v:
2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99b48082194af63239925ec7122d1365
https://doi.org/10.1109/ceidp55452.2022.9985386
https://doi.org/10.1109/ceidp55452.2022.9985386
Autor:
Yuichi Murakami, Yuji Muramoto
Publikováno v:
2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b01f4360341cfc0fde4a9e232a771983
https://doi.org/10.1109/ceidp55452.2022.9985255
https://doi.org/10.1109/ceidp55452.2022.9985255
Publikováno v:
IEEJ Transactions on Electrical and Electronic Engineering. 17:37-42
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::471a4fec03a58af0550a6d99c4e89c06
https://doi.org/10.1002/tee.23485
https://doi.org/10.1002/tee.23485
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 141:428-434
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbdd2034c8be88105105cb0ab8667825
https://doi.org/10.1541/ieejfms.141.428
https://doi.org/10.1541/ieejfms.141.428
Publikováno v:
IEEJ Transactions on Electrical and Electronic Engineering. 16:505-510
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9799c84231a9a4a543ef7e559e2cca9d
https://doi.org/10.1002/tee.23323
https://doi.org/10.1002/tee.23323
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 140:1336-1342
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e38bf3d280ac2f1fb5085cd45de2ec8
https://doi.org/10.1541/ieejeiss.140.1336
https://doi.org/10.1541/ieejeiss.140.1336
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 140:149-155
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0fed39b250e5f430960a90b89eff317
https://doi.org/10.1541/ieejfms.140.149
https://doi.org/10.1541/ieejfms.140.149
Publikováno v:
IEEJ Transactions on Electrical and Electronic Engineering. 14:1002-1007
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ac1ba8d5407b8e0254653f9a98643d1
https://doi.org/10.1002/tee.22895
https://doi.org/10.1002/tee.22895
Publikováno v:
Electronics and Communications in Japan. 104
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74032632188d8f3c2e0f6f6e32f669e4
https://doi.org/10.1002/ecj.12301
https://doi.org/10.1002/ecj.12301