Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Yuihiro Nanen"'
Autor:
Muneharu Kato, Keiko Inoue, Hirohumi Seki, Tsunenobu Kimoto, Yusaku Tanahashi, Hideki Sako, Yuihiro Nanen, Keiko Matsuda, Masanobu Yoshikawa
Publikováno v:
Applied Spectroscopy. 65:543-548
We used Fourier transform infrared (FT-IR) spectroscopy to characterize silicon dioxide (SiO(2)) films on a 4H-SiC(0001) Si face. We found that the peak frequency of the transverse optical (TO) phonon in SiO(2) films grown on a 4H-SiC substrate agree
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::137496dfb0d8ddb0f3405b745ab80c3c
https://doi.org/10.1366/10-06186
https://doi.org/10.1366/10-06186
Autor:
Masanobu Yoshikawa1, Hirohumi Seki1, Keiko Inoue1, Keiko Matsuda1, Yusaku Tanahashi1, Hideki Sako1, Yuihiro Nanen2, Muneharu Kato2, Tsunenobu Kimoto2
Publikováno v:
Applied Spectroscopy. May2011, Vol. 65 Issue 5, p543-548. 6p.