Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Yuetao Han"'
Publikováno v:
Agronomy, Vol 14, Iss 6, p 1114 (2024)
The grain filling rate (GFR) plays a crucial role in determining grain yield. However, the regulatory and molecular mechanisms of the grain filling rate (GFR) in foxtail millet remains unclear. In this study, we found that the GFR of ′Changnong No.
Externí odkaz:
https://doaj.org/article/514f796c947f4f4a91e377839ec5a8e3
Publikováno v:
The Journal of Engineering (2019)
Since many modern multi-functional radars emitting dense complex signals are applied in the complex electromagnetic environment, it is challenge to classify and identify the radar emitters in the electronic reconnaissance field. In order to classify
Externí odkaz:
https://doaj.org/article/3d6f1739bdfb492cba5358d2f0695a55
Publikováno v:
AIP Advances, Vol 9, Iss 1, Pp 015010-015010-5 (2019)
Nano-indentation is a destructive measurement that introduces non-uniform residual stress around each nano-indentation. Herein, the residual stress distribution around a Berkovich nano-indentation on (001)- and (111)-plane silicon was studied by micr
Externí odkaz:
https://doaj.org/article/df7c8a822056494cbfc7dedd2ec254c1
Publikováno v:
The Journal of Engineering (2019)
Since many modern multi-functional radars emitting dense complex signals are applied in the complex electromagnetic environment, it is challenge to classify and identify the radar emitters in the electronic reconnaissance field. In order to classify
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::da59b743f8b019d0c71a559ff68d808a
https://digital-library.theiet.org/content/journals/10.1049/joe.2019.0579
https://digital-library.theiet.org/content/journals/10.1049/joe.2019.0579
Publikováno v:
AIP Advances, Vol 9, Iss 1, Pp 015010-015010-5 (2019)
Nano-indentation is a destructive measurement that introduces non-uniform residual stress around each nano-indentation. Herein, the residual stress distribution around a Berkovich nano-indentation on (001)- and (111)-plane silicon was studied by micr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ca5dc52392f8ceae68befa3a65e0cba6
https://doi.org/10.1063/1.5080179
https://doi.org/10.1063/1.5080179
Publikováno v:
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT. 25:842-849
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1f79f4ff2a8c112b12cb6189701b390
https://doi.org/10.3724/sp.j.1187.2011.00842
https://doi.org/10.3724/sp.j.1187.2011.00842
Publikováno v:
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT. 25:682-687
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::460bf21263a0fed2690cf82cc5f24df0
https://doi.org/10.3724/sp.j.1187.2011.00682
https://doi.org/10.3724/sp.j.1187.2011.00682
Autor:
Han, Yuetao1 (AUTHOR) hytp0402@163.com, Zhao, Peiyue1,2 (AUTHOR) zpy837643595@163.com, Zhao, Yuan1,3 (AUTHOR) zy991108@126.com, Liu, Min1,3 (AUTHOR) lm7005210225@163.com, Guo, Erhu1,2 (AUTHOR) guoerhu2003@163.com, Wang, Guoliang1,2 (AUTHOR) wangguoliangwz@126.com, Zhang, Aiying1,2,3 (AUTHOR) zay1012@126.com
Publikováno v:
Agronomy. Jun2024, Vol. 14 Issue 6, p1114. 20p.
Publikováno v:
AIP Advances; Jan2019, Vol. 9 Issue 1, pN.PAG-N.PAG, 5p