Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Yuankang Chen"'
Autor:
Xingqun Zhan, Yuankang Chen
Publikováno v:
Aerospace Systems. 4:179-189
Global Navigation Satellite System (GNSS) vulnerability researches aim to improve GNSS application reliability, and is of great significance to the continuity of positioning, navigation, and timing services. The research on GNSS vulnerability can be
Autor:
Xiongfeng Wang, Wugang Liao, Tingke Rao, Yuanliang Zhou, Yuankang Chen, Yudong Pang, Xiaopei Chen, Guocheng Bao
Publikováno v:
2022 IEEE 5th International Conference on Electronics Technology (ICET).
Publikováno v:
IET Radar, Sonar & Navigation. 14:439-447
GNSS intermediate spoofing is a big threat to GNSS-dependent services because of its strong concealment. When the carrier Doppler of the spoofing signal is not locked to that of the authentic signal, such spoofing will result in the presence of dual-
Autor:
Xiaopei Chen, Xiongfeng Wang, Yudong Pang, Guocheng Bao, Jie Jiang, Peng Yang, Yuankang Chen, Tingke Rao, Wugang Liao
Publikováno v:
Small Methods. 7:2201156
Printed electronics, which fabricate electrical components and circuits on various substrates by leveraging functional inks and advanced printing technologies, have recently attracted tremendous attention due to their capability of large-scale, high-
Publikováno v:
Chinese Physics B. 32:028502
A novel structure of low-voltage trigger silicon-controlled rectifiers (LVTSCRs) with low trigger voltage and high holding voltage is proposed for electrostatic discharge (ESD) protection. The proposed ESD protection device possesses an ESD implant a
Publikováno v:
2021 9th International Symposium on Next Generation Electronics (ISNE).
The thermal sensing properties of carbon nanocomposites were studied in this work. Two kinds carbon nanocomposites composed of thermoplastic polyurethane (TPU) and multi-walled carbon nanotubes (MWCNTs) were characterized by infrared camera and tempe
Publikováno v:
Advanced Electronic Materials. 8:2270008
Reliability Issues of Thin Film Transistors Subject to Electrostatic Discharge Stresses: An Overview
Publikováno v:
Advanced Electronic Materials. 8:2100886