Zobrazeno 1 - 10
of 158
pro vyhledávání: '"Yuanfu Zhao"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 11, Pp 179-189 (2023)
The integration density of electronic systems is limited by the reliability of the integrated circuits. To guarantee the overall performance, the integrated circuit reliability must be modeled and analyzed at the early design stage. This paper review
Externí odkaz:
https://doaj.org/article/76ff7c673f024195b26807e202ddedf7
Publikováno v:
IEEE Access, Vol 10, Pp 113376-113396 (2022)
A fast and robust template matching scheme, called Matching by Slice Transform Matrix Mapping (MSTMM), is proposed for the matching difficulty under occluded scenarios caused by nonlinear intensity differences and structure differences between visibl
Externí odkaz:
https://doaj.org/article/af354cb051e14654b3d9f88861bebba3
Autor:
Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Yu Wu, Dongqing Hu, Xingyu Fang, Zhonghan Deng
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 9, Pp 839-845 (2021)
A novel split-gate-trench MOSFET integrated with normal gate and built-in channel diode (BCD) in the same trench is proposed and simulated with Sentaurus TCAD in this paper. Compared with the conventional SGT MOSFET (C-SGT MOS) and conventional SGT M
Externí odkaz:
https://doaj.org/article/ac524d95b4644f44b857ea72fa796904
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 8, Pp 619-625 (2020)
In this paper, the SiC planar MOSFET with built-in reverse MOS-channel diode (SiC MCDMOSFET) is investigated utilizing TCAD simulation tools. When the device is working as a freewheeling diode, the operation of the parasitic body diode is suppressed
Externí odkaz:
https://doaj.org/article/b2b25da3322c4933afa346b8dde62d0c
Autor:
Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Liang Wang, Tongde Li, Xingyu Fang, Guo Jia, Zhonghan Deng
Publikováno v:
IEEE Transactions on Electron Devices. 70:2947-2955
Publikováno v:
Circuits, Systems, and Signal Processing. 41:6694-6708
Autor:
Yuan Li, Xintian Zhou, Yuanfu Zhao, Yunpeng Jia, Dongqing Hu, Yu Wu, Liqi Zhang, Zibo Chen, Alex Q. Huang
Publikováno v:
IEEE Transactions on Electron Devices. 69:2521-2527
Publikováno v:
Second International Conference on Digital Society and Intelligent Systems (DSInS 2022).
Autor:
Tongde Li, Yuanfu Zhao, Liang Wang, Lei Shu, Hongchao Zheng, Weiyi Cao, Jingshuang Yuan, Junlin Li, Chenhui Wang
Publikováno v:
IEEE Transactions on Nuclear Science. 69:340-348
Autor:
Shuang Liu, Jincheng Zhang, Shenglei Zhao, Lei Shu, Xiufeng Song, Xuexue Qin, Yinhe Wu, Weihang Zhang, Tongde Li, Liang Wang, Zhihong Liu, Yuanfu Zhao, Yue Hao
Publikováno v:
IEEE Transactions on Electron Devices. 69:973-980