Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Yuan-Tai Lin"'
Would you like to add the capabilities of the Non-Volatile Memory (NVM) as a storage element in your silicon integrated logic circuits, and as a trimming sector in your high voltage driver and other silicon integrated analog circuits? Would you like
Publikováno v:
Logic Non-Volatile Memory: The NVM Solutions from eMemory
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12bf83945ec4b64b2db4d80c22ccbc1b
https://doi.org/10.1142/9789814460910_0002
https://doi.org/10.1142/9789814460910_0002
Autor:
Zhi-Bin Kuo, Cheng-Jye Liu, Chen Ying-Je, Yu-Shiung Tsai, Zheng-Jie Lee, Wein-Town Sun, Yuan-Tai Lin, Hong-Yi Liao, Fang Shang-Wei
Publikováno v:
2012 4th IEEE International Memory Workshop.
A dynamic programming method of Channel Hot Hole Induced Hot Electron (CHHIHE) injection with programming-current-clamped (PCC) scheme on P-channel SONOS application is proposed in this paper. With the PCC scheme, a better programming efficiency and
Autor:
Chien-Hung Ho, Yuan-Tai Lin, Ming-Chou Ho, Shu-Yueh Lee, Wei-Wu Liao, Shin-Chen Wang, Shih-Chan Huang, Ching-Yuan Lin, Charles Ching-Hsiang Hsu, Chung-Hung Lin
Publikováno v:
MTDT
This paper presents the embedded OTP fuse in standard CMOS logic compatible process without additional mask. The embedded OTP fuse can be programmed in 100/spl mu/s per byte and be accessed in 6ns for 32 bits at once. The 32-bit OTP fuse takes less t
Autor:
Ching-Yuan Lin, Chung-Hung Lin, Chien-Hung Ho, Wei-Wu Liao, Shu-Yueh Lee, Ming-Chou Ho, Shin-Chen Wang, Shih-Chan Huang, Yuan-Tai Lin, Charles Ching-Hsiang Hsu
Publikováno v:
2005 IEEE International Workshop on Memory Technology, Design & Testing (MTDT'05); 2005, p13-15, 3p