Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Yu.A. Voronov"'
Autor:
Yu.A. Voronov, Denis Veselov
Publikováno v:
Physics of Atomic Nuclei. 79:1678-1681
The mean range and its standard deviation are calculated for boron ions implanted into silicon with energies below 10 keV. Similar characteristics are calculated for indium ions with energies below 200 keV. The obtained results are presented in tabul
Autor:
Sabina Spiga, A. V. Sogoyan, Andrei Zenkevich, Yu.A. Voronov, V. I. Chichkov, V. N. Nevolin, Yu. Yu. Lebedinskii, N. S. Barantsev, Yu. A. Matveev, M. Fanchulli
Publikováno v:
Russian microelectronics 39 (2010): 165–174.
info:cnr-pdr/source/autori:Zenkevich, A. V.; Lebedinskii, Yu. Yu.; Matveev, Yu. A.; Barantsev, N. S.; Voronov, Yu. A.; Sogoyan, A. V.; Nevolin, V. N.; Chichkov, V. I.; Spiga, S.; Fanchulli, M./titolo:Synthesis and Investigation of New Materials in MIS Structures for the Development of Physical Foundations of CMOS Technologies of Nanoelectronics/doi:/rivista:Russian microelectronics/anno:2010/pagina_da:165/pagina_a:174/intervallo_pagine:165–174/volume:39
info:cnr-pdr/source/autori:Zenkevich, A. V.; Lebedinskii, Yu. Yu.; Matveev, Yu. A.; Barantsev, N. S.; Voronov, Yu. A.; Sogoyan, A. V.; Nevolin, V. N.; Chichkov, V. I.; Spiga, S.; Fanchulli, M./titolo:Synthesis and Investigation of New Materials in MIS Structures for the Development of Physical Foundations of CMOS Technologies of Nanoelectronics/doi:/rivista:Russian microelectronics/anno:2010/pagina_da:165/pagina_a:174/intervallo_pagine:165–174/volume:39
Certain results of experimental investigations of recent years devoted to new materials of undergate dielectrics and gates for field-effect MOS transistors based on high-k metal oxides and metal layers, respectively, are presented. The laboratory tec
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 151:012031
A new optical carbon dioxide sensor based on the change in glow intensity of the Europium-III complex, caused by CO2 absorption to various pH-indicators (thymol blue, phenol red and cresol red) of carbon dioxide was developed, and its sensitive prope
Publikováno v:
Journal of Physics: Conference Series. 748:012017
The paper is devoted to the study of deep reactive ion etching of silicon using diode plasma etcher system with a low-power source. Silicon wafers were etched in a sulfur hexafluoride plasma and sulfur hexafluoride/oxygen plasma. The maximum achieved
Publikováno v:
Journal of Physics: Conference Series. 748:012015
The paper discusses an analytical model of plasma-chemical etching in planar diode- type reactor. Analytical expressions of etch rate and etch anisotropy were obtained. It is shown that etch anisotropy increases with increasing the ion current and io
Autor:
Yu.A. Voronov, A. B. Simakov, V. V. Sosnovtsev, E. Onishchenko, T. A. Sugrobova, S. I. Suchkov, S. A. Voronov
Publikováno v:
Instruments and experimental techniques, 47(2), 191-193
Scopus-Elsevier
Scopus-Elsevier
A safety fuse has been designed for the electrical protection of gas-filled detectors in the ATLAS experiment at CERN (Geneva, Switzerland). The fuse is a polished lithium niobate plate with a titanium strip of 91-kΩ resistance deposited by the phot
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d78ac7702d628d72e3775700ba51851
https://research.rug.nl/en/publications/984948fe-7bbb-4236-bb7c-4b8ac3faf29d
https://research.rug.nl/en/publications/984948fe-7bbb-4236-bb7c-4b8ac3faf29d
Autor:
Yu.A. Voronov, Denis Veselov
Publikováno v:
Physics Procedia. :423-427
This paper is aimed at studying the influence of high temperature annealing on the films of silicon oxynitride, obtained by reactive magnetron sputtering of silicon in the environment of argon, nitrogen and oxygen. Annealing of the films was performe
Publikováno v:
Physics Procedia. :495-499
The aim of the paper is the research of dielectric membrane films obtained by reactive magnetron sputtering. Simulation of temperature distribution on the membrane structures of different elemental composition in the process of heating and cooling wa
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Akademický článek
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