Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Yu.A. Palchun"'
Autor:
Yu.A. Palchun, I. B. Yelistratova
Publikováno v:
2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
Any parametres have a relevant Annotation - mean time between failures diminishes in the process of system activity before some minimum value, corresponding to a set stationary process of restoration. This fact causes necessity to study in detail iss
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21f1c70a4188ed7c41cbbb6a3733e1c1
https://doi.org/10.1109/apeie.2014.7040869
https://doi.org/10.1109/apeie.2014.7040869
Publikováno v:
2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
A method for the analysis and algorithm metrological evaluation of interference of radio frequency waves in distribution network supplying telecommunications facilities. We consider a model of electrical circuits supply substation and an algorithm fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::910fb4cd5dbebd24b40343c164ab35aa
https://doi.org/10.1109/apeie.2014.7040884
https://doi.org/10.1109/apeie.2014.7040884
Publikováno v:
2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
The paper presents the main results of the research and development carried out in the Siberian Research Institute of Metrology for 70 years of its existence. There is represented the history of the Institute, as well as tasks that are met by members
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6806e59b9354426edc3b5f648a658de6
https://doi.org/10.1109/apeie.2014.7040860
https://doi.org/10.1109/apeie.2014.7040860
Publikováno v:
2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
In this work is the analysis of the impedance of memory, shown by example for calculating the parameters of the terrestrial lightning rod, and defining the requirements for the underground part of the memory.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20f9d6352c874259c553f276b50bf137
https://doi.org/10.1109/apeie.2014.7040885
https://doi.org/10.1109/apeie.2014.7040885
Autor:
I. B. Yelistratova, Yu.A. Palchun
Publikováno v:
2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
Expansion of scales of industrial automation, increase of requirements to accuracy of managerial decision-making need in improvement metrological support on production. To decide this task, appropriate mathematic models of metrological systems for pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7f32f984f13908bd35f2fe5ab70d8cf
https://doi.org/10.1109/apeie.2014.7040871
https://doi.org/10.1109/apeie.2014.7040871
Publikováno v:
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
On the basis of the generalized model of measurement the main equations of measurement of processes in QMS are received.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55b481e51d539a1bc693ef1ed9f57cae
https://doi.org/10.1109/apeie.2012.6629150
https://doi.org/10.1109/apeie.2012.6629150
Autor:
I. B. Yelistratova, Yu.A. Palchun
Publikováno v:
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
The reliability requirements for modern systems, consisting of numerous elements and largely automated, are not easy to follow. Unlike with simple devices the reliability of modern goods is in many cases the main criterion in evaluating whether their
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e250480b9191a6e628baa27d1aa18ba
https://doi.org/10.1109/apeie.2012.6629148
https://doi.org/10.1109/apeie.2012.6629148
Autor:
I. B. Yelistratova, Yu.A. Palchun
Publikováno v:
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
Growing manufacture automation, increasing demands as to the quality of management decisions require the refining of industry metrological support. To meet the demand the corresponding mathematical system models of metrological support and manufactur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::234e40d6201277cf15f54604ff1bed56
https://doi.org/10.1109/apeie.2012.6629147
https://doi.org/10.1109/apeie.2012.6629147
Autor:
I. B. Yelistratova, Yu.A. Palchun
Publikováno v:
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
Any parametres have a relevant uncertainty in a real industrial process. Quality of measurements and quality of production are connected. If the quality of measurements does not satisfy requirements of technological process quality of the production
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::907c8a59a06e9f38c57a89e469c4b9a0
https://doi.org/10.1109/apeie.2012.6629149
https://doi.org/10.1109/apeie.2012.6629149
Publikováno v:
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE).
Graphical representation of systems of metrological procurement and production control is based on using structure diagram where elements have 2n poles. These elements can be represented as directed graphs. To obtain graphical models one can use S-gr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75b5028d9da984ffafb4f99043409460
https://doi.org/10.1109/apeie.2012.6628959
https://doi.org/10.1109/apeie.2012.6628959