Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Yu.A. Kudriavtsev"'
Autor:
V. Yu. Davydov, V. V. Ratnikov, V. A. Vekshin, V. V. Mamutin, Sergei Ivanov, Valentin V. Emtsev, Yu.A. Kudriavtsev, B. Ya. Ber
Publikováno v:
ResearcherID
We report on the first attempts of Mg doping of hexagonal InN/Al2O3(0001) films grown by plasma-assisted molecular beam epitaxy. A dramatic improvement of crystalline quality of InN : Mg epilayers has been observed at the magnesium concentration in t
Autor:
C. T. Foxon, J.W. Orton, Tin S. Cheng, S. E. Hooper, Yu.A. Kudriavtsev, Sergei V. Novikov, B. Ya. Ber
Publikováno v:
Journal of Crystal Growth. 197:7-11
We report Mg doping experiments in GaN grown by plasma-enhanced molecular beam epitaxy on sapphire and GaAs substrates. Secondary ion mass spectrometry was used to measure the Mg concentration as a function of Mg flux. Our data show a linear dependen
Autor:
S N Novikov, L.B Flannery, C. T. Foxon, J.W. Orton, Ian Harrison, A. V. Andrianov, D.E. Lacklison, Tin S. Cheng, B. Ya. Ber, Yu.A. Kudriavtsev, S. E. Hooper, D J Dewsnip
Publikováno v:
Semiconductor Science and Technology. 13:927-935
We describe measurements of the electrical and luminescence properties of Mg-doped GaN films grown by plasma-enhanced molecular beam epitaxy on sapphire and GaAs substrates. Secondary ion mass spectroscopy measurements were used to determine the tota
Autor:
Yu. M. Zadiranov, A. A. Sitnikova, W. V. Lundin, A. V. Sakharov, A. S. Usikov, N.M. Shmidt, U.I. Ushakov, V. A. Solov’ev, B. V. Pushnyi, M.V. Stepanov, N. N. Faleev, T. V. Shubina, B. Ya. Ber, Yu.A. Kudriavtsev
Publikováno v:
Materials Science Forum. :1315-1318
Autor:
N. J. Jeffs, J.W. Orton, C. T. Foxon, L.B Flannery, D J Dewsnip, Tin S. Cheng, Yu.A. Kudriavtsev, Sergei V. Novikov, B. Ya. Ber, Ian Harrison
Publikováno v:
Materials Science Forum. :1217-1220
Autor:
Tin S. Cheng, J.W. Orton, Yu.A. Kudriavtsev, B. Ya. Ber, D.E. Lacklison, C. T. Foxon, A. V. Merkulov, Sergei V. Novikov
Publikováno v:
Semiconductor Science and Technology. 13:71-74
The incorporation of magnesium and carbon in GaN grown by molecular beam epitaxy (MBE) has been investigated by secondary ion mass spectroscopy (SIMS) and other techniques. We have grown Mg:GaN in a wide range of chemical concentrations -. Low temper
Autor:
Ian Harrison, J.W. Orton, L.B Flannery, C. T. Foxon, J.D. Dewsnip, Sergei V. Novikov, B. Ya. Ber, N. J. Jeffs, Tin S. Cheng, Yu.A. Kudriavtsev
Publikováno v:
Journal of Crystal Growth. :516-518
We have investigated the properties of Mg-doped GaN grown by molecular beam epitaxy. Active nitrogen is produced by an Oxford Applied Research CARS25 plasma source. Further details of the methods used to grow the films have been presented elsewhere [
Autor:
P. A. Blagnov, V. A. Solov’ev, David J. Brinker, Yu.A. Kudriavtsev, Carlos Vargas-Aburto, M. E. Boiko, R.M. Uribe, L.B. Karlina, V. V. Kozlovskii
Publikováno v:
Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997.
This paper reports on the radiation resistance of In/sub 0.53/Ga/sub 0.47/As (InGaAs) cells with a p/n configuration. These solar cells can be used as bottom cells in high-efficiency tandems with wide gap top cells and as thermophotovoltaic converter
Autor:
W. V. Lundin, N.N. Ledentsov, Yu.A. Kudriavtsev, U.I. Ushakov, A.V. Lunev, Yu.M. Sherniakov, A. V. Sakharov, A. S. Usikov
Publikováno v:
MRS Internet Journal of Nitride Semiconductor Research. 3
Thick AlGaN layers and GaN/AlGaN heterostructures were grown by low pressure MOCVD on (0001) sapphire substrates utilizing a low temperature AlGaN buffer layer. The distribution of Al in the thick AlGaN layers was observed to be non-uniform as a func
Autor:
A. P. Kovarsky, D. N. Stroganov, Samuel Clagett Strite, Tilman A. Beierlein, M. A. Yagovkina, Yu. L. Kretser, Yu.A. Kudriavtsev
Publikováno v:
MRS Internet Journal of Nitride Semiconductor Research. 3
We demonstrate that our secondary mass ion spectroscopy (SIMS) method for the determination of the mole fraction in solid InxGa1-xN solutions is accurate and reproduceable without need of reference samples. The method is based on measuring relative c