Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Yu. P. Pershyn"'
Publikováno v:
Thin Solid Films. 520:314-319
The structure of molybdenum layers deposited by direct current magnetron sputtering onto the amorphous silicon (a-Si) layers as function of nominal layer thickness was studied by methods of transmission electron microscopy. Molybdenum layers with nom
Autor:
V. S. Chumak, Yu. P. Pershyn, J. F. Seely, A. Yu. Devizenko, Evgeniy N. Zubarev, V. V. Kondratenko
Publikováno v:
Journal of Nano- and Electronic Physics. 10:02032-1
Autor:
Evgeniy N. Zubarev, V. V. Kondratenko, E. M. Gullikson, Yu. P. Pershyn, D. L. Voronov, A. Yu. Devizenko
Publikováno v:
Journal of Nano- and Electronic Physics. 10:05025-1
Методами рентгенівської дифракції (0,154 нм), просвічувачої електронної мікроскопії поперечних зрізів і рефлектометрії в області екстрем
Publikováno v:
Journal of Nano- and Electronic Physics. 9:02029-1
Autor:
Georgiy O. Vaschenko, V. V. Kondratenko, Yu. P. Pershyn, A. V. Vinogradov, Yu. A. Uspenskii, Jorge J. Rocca, I. A. Artyukov, M. Grisham, Carmen S. Menoni, D. L. Voronov, E. N. Zubarev, V. A. Sevryukova
Publikováno v:
Springer Proceedings in Physics ISBN: 9781402060175
Specific structural changes in Sc/Si multilayers (MLs) irradiated by nanosecond 46.9-nm single laser pulses with fluences of 0.04-5.00 J/cm2 were studied by methods of SEM and cross-sectional TEM. The threshold damage was found to be 0.08 J/cm2. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fab7d8e1fc93dfc476059911cf31f821
https://doi.org/10.1007/978-1-4020-6018-2_72
https://doi.org/10.1007/978-1-4020-6018-2_72
Autor:
Carmen S. Menoni, M. Grisham, Libor Juha, Jorge J. Rocca, I. A. Artioukov, Evgeniy N. Zubarev, Georgiy O. Vaschenko, V. V. Kondratenko, Michal Bittner, Aleksandr V Vinogradov, Yu. P. Pershyn
Publikováno v:
Laser Ablation and its Applications ISBN: 9780387304526
In summary, we have realized a series of experiments with a compact 46.9 nm wavelength laser that produces intense pulses of nanosecond duration to study the ablation behavior of metals, common polymers, and Sc/Si multilayers. The key ablation proces
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55725cbea007a47054747bd0174f9fc7
https://doi.org/10.1007/978-0-387-30453-3_21
https://doi.org/10.1007/978-0-387-30453-3_21
Autor:
M. Grisham, I. A. Artioukov, Yu. P. Pershyn, Dmitriy L. Voronov, Aleksandr V Vinogradov, Jorge J. Rocca, Carmen S. Menoni, Evgeniy N. Zubarev, Georgiy O. Vaschenko, V. V. Kondratenko, V.A. Sevryukova
Publikováno v:
Optics letters. 29(6)
The damage threshold and damage mechanism of extreme-ultraviolet Sc/Si multilayer mirror coatings are investigated with focused nanosecond pulses at 46.9-nm radiation from a compact capillary-discharge laser. Damage threshold fluences of approximatel
Autor:
Aleksandr V Vinogradov, A. Liddle, David Attwood, M. Grisham, I. A. Artioukov, Erik H. Anderson, Yu. P. Pershyn, Fernando Brizuela, Mario C. Marconi, V. V. Kondratenko, C. Brewer, Georgiy O. Vaschenko, Carmen S. Menoni, W. Chao, Héctor Mancini, Jorge J. Rocca
Publikováno v:
Scopus-Elsevier
We report sub-140 nm resolution imaging with 46.9 nm radiation from a compact capillary-discharge laser. This result was obtained using a combination of a Sc/Si multilayer-coated Schwarzschild condenser and free-standing imaging zone plate.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::18667f37e81ff3f1a617b58a7568f78a
http://www.scopus.com/inward/record.url?eid=2-s2.0-27144556254&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-27144556254&partnerID=MN8TOARS
Autor:
Ravinet, N., Meltchakov, E., Lejars, A., Troussel, Ph., Do, A., Kozioziemski, B., Delmotte, F.
Publikováno v:
Review of Scientific Instruments; Oct2023, Vol. 94 Issue 10, p1-9, 9p
Autor:
Juha, L., Hájková, V., Chalupský, J., Vorlícˇek, V., Ritucci, A., Reale, A., Zuppella, P., Störmer, M.
Publikováno v:
Journal of Applied Physics; May2009, Vol. 105 Issue 9, p093117-093123, 6p, 1 Color Photograph, 1 Diagram, 4 Graphs