Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Yu. O. Volkov"'
Autor:
A. A. Mamedov, N. A. Geppe, A. A. Skakodub, Yu. O. Volkov, S. A. Parshikova, N. V. Gorlova, L. A. Mazurina, O. V. Dudnik
Publikováno v:
Rossiyskiy Vestnik Perinatologii i Pediatrii (Russian Bulletin of Perinatology and Pediatrics). 67:71-75
The article discusses the interdisciplinary interaction of pediatricians, surgeons, orthodontists, anesthesiologists, and otorhinolaryngologists in the complex rehabilitation of newborns with bilateral cleft lip and palate. Purpose. The aim of the st
Autor:
Aleksey M. Tikhonov, N. D. Stepina, A. D. Nuzhdin, N. F. Bunkin, V. E. Asadchikov, Boris S. Roshchin, Vladimir Volkov, Yu. O. Volkov
Publikováno v:
Physics of Wave Phenomena. 29:131-135
An X-ray reflectivity analysis has shown that the composition of liquid substrates affects the structure of deposited Nafion (Teflon copolymer) films. A model of Nafion monomer, developed based on small-angle X-ray scattering data, is used to interpr
Publikováno v:
Instruments and Experimental Techniques. 64:172-176
A universal thermostatic chamber has been designed for X-ray scattering studies of various types of adsorption layers at air–water and oil–water interfaces. The camera can be used both on a laboratory diffractometer with a horizontal arrangement
Autor:
Aleksey M. Tikhonov, Yu. O. Volkov, Boris S. Roshchin, Veijo Honkimäki, Maria Valeria Blanco, V. E. Asadchikov
Publikováno v:
Journal of Experimental and Theoretical Physics. 132:1-17
The structure of the planar surface of colloidal solutions of amorphous 27-nm silica sol particles enriched with heavy K+, Rb+, and Cs+ alkali ions is studied by the methods of reflectometry and diffuse (nonspecular) scattering of synchrotron radiati
Autor:
A. V. Butashin, V. E. Asadchikov, A. N. Deryabin, A. E. Blagov, Boris S. Roshchin, F. N. Chukhovskii, A. E. Muslimov, A. V. Targonskii, Yu. O. Volkov, A. I. Protsenko, V. M. Kanevskii
Publikováno v:
Technical Physics. 65:400-406
X-ray diffractometry, X-ray profilometry, atomic-force microscopy, and sclerometer tests are employed in the study of R-cut plates of sapphire single crystals grown with the aid of the Kyropoulos technique and used as substrates for the silicon-on-sa
Autor:
Yu. O. Volkov, Aleksey M. Tikhonov
Publikováno v:
Journal of Experimental and Theoretical Physics. 129:368-374
The structure of an adsorption octadecanamide film at the planar toluene–water interface is studied by X-ray reflectometry using synchrotron radiation with photon energy of 15 keV. The electron density (polarizability) profiles, according to which
Autor:
Yu. A. Ermakov, Aleksey M. Tikhonov, V. E. Asadchikov, A. D. Nuzhdin, Veijo Honkimäki, Yu. O. Volkov, Boris S. Roshchin
Publikováno v:
JETP Letters. 109:334-339
The effect of the adsorption of a polypeptide on the lateral interaction of dimyristoylphosphatidylserine molecules in different phase states on the surface of a 10 mM KCl aqueous solution has been studied. Changes in the surface pressure and Volta p
Publikováno v:
Semiconductors. 52:2049-2053
X-ray reflectometry of whispering galleries (WGs), which propagate along meniscuses of deionized water or silica hydrosols (Ludox® SM) enriched by Cs+ ions, was analyzed for the first time. The measurements were performed using the diffractometer wi
Autor:
Veijo Honkimäki, Maria Valeria Blanco, Yu. O. Volkov, V. E. Asadchikov, Boris S. Roshchin, Aleksey M. Tikhonov
Publikováno v:
JETP Letters. 107:384-389
The structure of the adsorbed layer of alkali ions on the surface of colloidal silica solutions with a particle size of 27 nm has been studied by reflectometry and diffuse scattering of synchrotron radiation with a photon energy of about 71 keV. Elec
Publikováno v:
Journal of Experimental and Theoretical Physics. 125:1051-1057
The molecular structure of dimyristoyl phosphatidylserine (DMPS) monolayers on a water substrate in different phase states has been investigated by X-ray reflectometry with a photon energy of ~8 keV. According to the experimental data, the transition