Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Yu. I. Plotnikov"'
Publikováno v:
Russian Microelectronics. 33:342-349
A method of SEM linear measurement is proposed in which the reference marker displayed on the screen is used as a standard. The method works in a wide range of magnification without magnification calibration. Calibration of the marker against the MSh
Publikováno v:
Chemical and Petroleum Engineering. 40:171-177
Autor:
A. V. Rakov, Yu. V. Ozerin, A. M. Prokhorov, Yu. A. Novikov, Yu. I. Plotnikov, E. S. Gornev, Ch. P. Volk
Publikováno v:
Russian Microelectronics. 31:207-223
Linear standards for the calibration of SEMs and AFMs are reviewed. Requirements to a surface pattern designed to serve as a universal standard for the above purpose are defined. A trapezoidal pitch structure is proposed, in which the sidewalls of ba
Publikováno v:
Measurement Techniques. 44:44-48
A geometric model of a scanning force microscope (atomic force microscope) (SFM) cantilever with micro- and nanostructures is considered. A linear gauge is proposed for SFM calibration and for definition of the SFM probe parameters. SEM and SFM metho
Publikováno v:
Russian Microelectronics; Nov2004, Vol. 33 Issue 6, p342-349, 8p
Publikováno v:
Combustion, Explosion, and Shock Waves. 23:51-54
The authors take into account the dynamics of temperature variation in the bridge when an electric current flows. The system of differential equations describing the dynamics of temperature variation in the bridge and in the surrounding layers of exp
Publikováno v:
Soviet Journal of Quantum Electronics. 8:70-71
An investigation was made of the characteristics of a matrix-addressable controlled transparency of 1 kbit capacity. Spatial modulation of the radiation was due to the dynamic scattering with memory in a mixture of nematic and cholesteric crystals. T