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pro vyhledávání: '"Yu-Wen Chern"'
Autor:
Yu-Wen Chern, 陳郁文
103
In the thesis, the optical modulation bandwidths of light-emitting transistors (LETs) at different bias conditions are measured and compared to investigate the influence of the voltage-dependent charge-removing mechanism within the active re
In the thesis, the optical modulation bandwidths of light-emitting transistors (LETs) at different bias conditions are measured and compared to investigate the influence of the voltage-dependent charge-removing mechanism within the active re
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/50952319000893569103
Publikováno v:
IEEE Transactions on Electron Devices. 62:4076-4081
The optical modulation bandwidths of light-emitting transistors (LETs) at different bias conditions are measured and compared to investigate the influence of the voltage-dependent charge-removing mechanism within the active region. The modulation ban