Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Yu-Wen Chern"'
Publikováno v:
IEEE Transactions on Electron Devices. 62:4076-4081
The optical modulation bandwidths of light-emitting transistors (LETs) at different bias conditions are measured and compared to investigate the influence of the voltage-dependent charge-removing mechanism within the active region. The modulation ban
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb08f237dfe6102139f427101772a7c6
https://doi.org/10.1109/ted.2015.2493566
https://doi.org/10.1109/ted.2015.2493566
Autor:
Yu-Wen Chern, 陳郁文
103
In the thesis, the optical modulation bandwidths of light-emitting transistors (LETs) at different bias conditions are measured and compared to investigate the influence of the voltage-dependent charge-removing mechanism within the active re
In the thesis, the optical modulation bandwidths of light-emitting transistors (LETs) at different bias conditions are measured and compared to investigate the influence of the voltage-dependent charge-removing mechanism within the active re
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/50952319000893569103
Publikováno v:
2014 OptoElectronics & Communication Conference & Australian Conference on Optical Fibre Technology; 2014, p1-104, 104p
Publikováno v:
2014 OptoElectronics & Communication Conference & Australian Conference on Optical Fibre Technology; 2014, p1-86, 86p
Publikováno v:
IEEE Transactions on Electron Devices; Dec2015, Vol. 62 Issue 12, p4076-4081, 6p
Publikováno v:
2014 OptoElectronics & Communication Conference & Australian Conference on Optical Fibre Technology; 2014, p970-972, 3p
Publikováno v:
2014 OptoElectronics & Communication Conference & Australian Conference on Optical Fibre Technology; 2014, p562-564, 3p