Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Yu-Hsun Hsueh"'
Publikováno v:
Nanomaterials, Vol 14, Iss 11, p 934 (2024)
This study developed a DC-free technique that used dark-mode scanning capacitance microscopy (DM-SCM) with a small-area contact electrode to evaluate and image equivalent oxide thicknesses (EOTs). In contrast to the conventional capacitance–voltage
Externí odkaz:
https://doaj.org/article/535c325299de450a9a4df455708e0e6e
