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pro vyhledávání: '"Yu nJie Zhou"'
Publikováno v:
ICCE-TW
CMOS technology can be applied to POWER MOSFET integrated Circuits(ICs) for vehicle power management system. However, the Electronic Discharged (ESD) reliability of the device is essential issue for Power MOSFETs. Because ESD failure is one of the mo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5645bf9c60a301d171e78f56cbf8083e
https://doi.org/10.1109/icce-tw52618.2021.9603026
https://doi.org/10.1109/icce-tw52618.2021.9603026
