Zobrazeno 1 - 10
of 70
pro vyhledávání: '"Yu V. Pisarevsky"'
Autor:
Y. A. Eliovich, A. E. Blagov, E. N. Ovchinnikova, K. A. Kozlovskaya, A. V. Targonskii, Yu. V. Pisarevsky, V. A. Shishkov, A. A. Mololkin, M. V. Kovalchuk
Publikováno v:
Crystallography Reports. 67:1061-1067
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d9964d34b607a5d28204bdcfd979d43
https://doi.org/10.1134/s1063774522070173
https://doi.org/10.1134/s1063774522070173
Autor:
Y. A. Eliovich, A. E. Blagov, A. G. Kulikov, A. V. Targonskii, Yu. V. Pisarevsky, A. I. Protsenko, V. I. Akkuratov, V. A. Korzhov, I. I. Petrov, I. V. Kubasov, A. M. Kislyuk, A. V. Turutin, M. D. Malinkovich, Yu. N. Parkhomenko, S. V. Salikhov, A. S. Machikhin, M. V. Kovalchuk
Publikováno v:
Crystallography Reports. 67:1041-1060
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef35b364b170878fb7bd96575ebddd29
https://doi.org/10.1134/s1063774522070161
https://doi.org/10.1134/s1063774522070161
Publikováno v:
Crystallography Reports. 67:791-798
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ab0580a835e787cedb1f1a0459e4587
https://doi.org/10.1134/s1063774522050121
https://doi.org/10.1134/s1063774522050121
Autor:
M. S. Folomeshkin, Yu. A. Volkovsky, P. A. Prosekov, G. B. Galiev, E. A. Klimov, A. N. Klochkov, S. S. Pushkarev, A. Yu. Seregin, Yu. V. Pisarevsky, A. E. Blagov, M. V. Kovalchuk
Publikováno v:
Crystallography Reports. 67:317-322
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::543fba2adc05df4d5b46923b8c5e643a
https://doi.org/10.1134/s1063774522030075
https://doi.org/10.1134/s1063774522030075
Autor:
Mikhail V. Kovalchuk, A. Yu. Seregin, M. S. Folomeshkin, M. D. Pavlyuk, P. A. Prosekov, A. E. Blagov, Yu. A. Volkovsky, Yu. V. Pisarevsky
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:927-933
The state of the surface layer of polished silicon substrates and the effect of surface-cleaning procedures, such as washing in an ultrasonic bath, etching, and vacuum annealing, is studied. The X-ray reflectivity technique is used to determine the r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8db3b6efe03a6a0d4ea9d170122c8241
https://doi.org/10.1134/s1027451021050207
https://doi.org/10.1134/s1027451021050207
Autor:
Yu. V. Pisarevsky, K. B. Il’ina, M. V. Kovalchuk, Petr V. Konarev, M. A. Marchenkova, A. S. Boikova
Publikováno v:
Crystallography Reports. 66:751-757
Abstract The influence of the precipitant type (LiCl, NaCl, KCl, NiCl2, and CuCl2) on the formation of oligomers (dimers and octamers) in lysozyme crystallization solutions at two protein concentrations has been investigated by small-angle X-ray scat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70976734eab35c90b0178a4ea25821c2
https://doi.org/10.1134/s1063774521050138
https://doi.org/10.1134/s1063774521050138
Autor:
M. A. Marchenkova, M. V. Kovalchuk, Yu. V. Pisarevsky, Yu. V. Kordonskaya, Yu. A. Dyakova, Vladimir I. Timofeev
Publikováno v:
Crystallography Reports. 66:525-528
Abstract The 10-nanosecond simulation of a lysozyme dimer, which is a fragment of the tetragonal lysozyme crystal structure, has been carried out by the molecular dynamics method at different simulation box sizes and precipitant concentrations in a s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c6033a1882acc84479379945cce5fbf
https://doi.org/10.1134/s106377452103010x
https://doi.org/10.1134/s106377452103010x
Publikováno v:
2022 Wave Electronics and its Application in Information and Telecommunication Systems (WECONF).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1206eef832f1847a9263dab47610a1c9
https://doi.org/10.1109/weconf55058.2022.9803581
https://doi.org/10.1109/weconf55058.2022.9803581
Autor:
A. E. Movsisyan, T. R. Muradyan, V. R. Kocharyan, A. Yu. Seregin, Yu. V. Pisarevsky, Ya. A. Eliovich, V. A. Korzhov, A. E. Blagov, A. V. Targonsky, Mikhail V. Kovalchuk
Publikováno v:
Journal of Contemporary Physics (Armenian Academy of Sciences). 55:376-382
At the RKFM stations in the NRC ‘Kurchatov institute’ the peculiarities of the effect of redistribution of the intensity of the diffracted synchrotron beam in the X-cut quartz crystals at the excitation of transverse resonant ultrasonic vibration
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2d80cc5ff06d7164ddfd7595842b4f3
https://doi.org/10.3103/s1068337220040064
https://doi.org/10.3103/s1068337220040064
Autor:
Mikhail V. Kovalchuk, V. I. Akkuratov, A. E. Blagov, Yu. V. Pisarevsky, I. A. Eliovich, P. A. Prosekov, A. V. Targonskii
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 14:756-761
A new approach is proposed for recording reciprocal space maps near the Bragg reflection using an adaptive bending element of X-ray optics based on a bidomain monolithic crystal of lithium niobate, which is necessary for time-resolved studies of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18c08c79a74f1cfeccbded51755d15c3
https://doi.org/10.1134/s1027451020040254
https://doi.org/10.1134/s1027451020040254