Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Yu V Cherpak"'
Publikováno v:
Superconductor Science and Technology. 20:1159-1164
The obtained electron backscattering diffraction data and high-resolution transmission electron microscopy have shown that the nanostructure of epitaxial HTS YBCO films evolves essentially with the film thickness. This happens due to a high depositio
Autor:
Yu.V. Fedotov, A. V. Semenov, V. A. Komashko, E. A. Pashitskii, Yu. V. Cherpak, Shi Xue Dou, V.M. Pan, S. M. Ryabchenko, C.G. Tretiatchenko, Alexey V. Pan
Publikováno v:
Physica C: Superconductivity. 401:316-319
Magnetic field, angular and temperature dependencies of the critical current density were measured by SQUID-magnetometry, ac magnetic susceptibility, and transport techniques in single-crystalline epitaxial YBCO films. The mechanism of vortex depinni
Autor:
S. M. Ryabchenko, V. A. Komashko, Yu.V. Fedotov, V.M. Pan, V. S. Flis, E. A. Pashitskii, Yu. V. Cherpak
Publikováno v:
Low Temperature Physics. 29:630-641
The dependence of the critical current density jc on the magnitude and direction of the magnetic field H is investigated in thin epitaxial films of YBa2Cu3O7−δ having a high value of jc in the absence of field (∼106 A/cm2 at 77 K) and a thicknes
Autor:
V O Moskaliuk, V.L. Svetchnikov, A. V. Semenov, Yu V Cherpak, C.G. Tretiatchenko, V. S. Flis, V.M. Pan
Publikováno v:
Journal of Physics: Conference Series. 97:012259
The critical current density, Jc, in epitaxial HTS YBCO films strongly depends on the film thickness, degrading from 7-8 MA/cm2 in very thin films (50-70 nm) to less than 1 MA/cm2 in much thicker ones. Electron backscattering diffraction and high-res