Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Yu, Sanghee"'
Autor:
Ha, Tae-Kyoung, Kim, Yongjo, Yu, SangHee, Kim, GwangTae, Jeong, Hoon, Park, JeongKi, Kim, Ohyun
Publikováno v:
In Solid State Electronics December 2020 174
Autor:
Ha, Jaekook, Lee, Sooho, Park, Myoungjin, Kim, Heunggyu, Jung, Yun Ku, Park, Gyehyun, Han, Changyeol, Yu, Sanghee, Kim, Hoilim, Min, Kyeongseo, Lee, Arong, Kang, Giho, Park, Jee Hoon, Hwang, Jaekwon, Min, Ji Hyun, Ha, Hyun Dong, Han, Yongseok, Yoon, Da-Eun, Chang, Hogeun, Kim, Kwang-Hee
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p353-356, 4p
Autor:
Kim, Yongjo, Ha, Tae-Kyoung, Yu, SangHee, Kim, GwangTae, Jeong, Hoon, Park, JeongKi, Kim, Ohyun
Publikováno v:
In Solid State Electronics October 2020 172
Autor:
Kim, Yongjo, Ha, Tae-Kyoung, Cho, Yong-Jung, Kang, Yun-Seong, Yu, SangHee, Kim, GwangTae, Jeong, Hun, Park, Jeong Ki, Kim, Ohyun
Publikováno v:
In Solid State Electronics May 2020 167
Autor:
Ha, Tae-Kyoung, Kim, Yongjo, Cho, Yong-Jung, Kang, Yun-Seong, Yu, SangHee, Kim, GwangTae, Jeong, Hoon, Park, Jeong Ki, Kim, Ohyun
Publikováno v:
In Solid State Electronics March 2020 165
Autor:
Ha, Jaekook, Lee, Sooho, Park, Myoungjin, Kim, Heunggyu, Jung, Yun Ku, Park, Gyehyun, Han, Changyeol, Yu, Sanghee, Kim, Hoilim, Min, Kyeongseo, Lee, Arong, Kang, Giho, Park, Jee Hoon, Hwang, Jaekwon, Min, Ji Hyun, Ha, Hyun Dong, Han, Yongseok, Yoon, Da-Eun, Chang, Hogeun, Kim, Kwang-Hee, Kim, Sungwoo, Noh, Seunguk, Kwak, Donghoon, Kim, Sehun, Yoon, Yeo-geon, Lee, Changhee
Publikováno v:
SID Symposium Digest of Technical Papers; June 2024, Vol. 55 Issue: 1 p353-356, 4p
Autor:
Ha, Jaekook, Shin, Dongwoo, Jung, Yun Ku, Kim, Sehun, Kim, Heunggyu, Noh, Seung Uk, Kim, Young il, Koo, Youngmo, Baek, Seogsoon, Kang, Yoonho, Yoo, SungHune, Hwang, Jaekwon, Kwak, Donghoon, Lee, Arong, Kim, Hoi‐Lim, Kim, Gyubong, Yu, SangHee, Yoon, Yeo Geon, Lee, Changhee
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2023, Vol. 54 Issue 1, p876-879, 4p
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2022, Vol. 53 Issue 1, p1229-1230, 2p