Zobrazeno 1 - 10
of 454
pro vyhledávání: '"Youssef, T"'
Autor:
Youssef T. Abdou, Sheri M. Saleeb, Khaled M. A. Abdel-Raouf, Mohamed Allam, Mustafa Adel, Asma Amleh
Publikováno v:
BMC Cancer, Vol 23, Iss 1, Pp 1-19 (2023)
Abstract Drug resistance is a major cause of the inefficacy of conventional cancer therapies, and often accompanied by severe side effects. Thus, there is an urgent need to develop novel drugs with low cytotoxicity, high selectivity and minimal acqui
Externí odkaz:
https://doaj.org/article/d1559ed69fb948d7a1f06f42ce681beb
Autor:
Abdou, Youssef T.1 (AUTHOR), Saleeb, Sheri M.1 (AUTHOR), Abdel-Raouf, Khaled M. A.2 (AUTHOR), Allam, Mohamed2 (AUTHOR), Adel, Mustafa1 (AUTHOR), Amleh, Asma1,2 (AUTHOR) aamleh@aucegypt.edu
Publikováno v:
BMC Cancer. 7/26/2023, Vol. 23 Issue 1, p1-19. 19p.
Publikováno v:
International Journal of Nanomedicine, Vol Volume 17, Pp 4723-4724 (2022)
Salaheldin TA, Loutfy SA, Ramadan MA, Youssef T, Mousa SA. Int J Nanomedicine. 2019;14:4397–4412. The Editor and Publisher of International Journal of Nanomedicine wish to retract the published article. Concerns were raised regarding the alleged du
Externí odkaz:
https://doaj.org/article/e3b6835b9cb6484ebd3f0da45b5fbd33
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
International Journal of Nanomedicine, Vol Volume 14, Pp 4397-4412 (2019)
Taher A Salaheldin,1,2 Samah A Loutfy,3 Marwa A Ramadan,4 Tareq Youssef,4 Shaker A Mousa11Pharmaceutical Research Institute, Albany College of Pharmacy and Health Sciences, Rensselaer, NY, USA; 2Nanotechnology and Advanced Materials Central Lab, Agri
Externí odkaz:
https://doaj.org/article/f61cc32ebf124cb9a84a47e1a118f52d
Publikováno v:
In Journal of Molecular Structure 5 December 2017 1149:626-631
Publikováno v:
In Journal of the Franklin Institute April 2017 354(6):2524-2542
Akademický článek
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Autor:
Youssef, T., Rmili, W., Woirgard, E., Azzopardi, S., Vivet, N., Martineau, D., Meuret, R., Le Quilliec, G., Richard, C.
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1997-2002