Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Young-Ryeol Choi"'
Autor:
Jongwook Park, Jung-Hwan Choi, Seung-Jun Bae, Si-Hyeong Cho, Seunseob Lee, Young-Ryeol Choi, In-Dal Song, Kwang-Il Park, Ki-Ho Kim, Jin-Seok Heo, Young-Soo Sohn, Dong-Hun Lee, Eunsung Seo, Junha Lee, Gil-Hoon Cha, Hyuck-Joon Kwon, Jin-Hyeok Baek, Daesik Moon, Youn-sik Park, Kyung-Soo Ha, Chang-Kyo Lee, Seok-Hun Hyun, Seong-Jin Jang
Publikováno v:
IEEE Journal of Solid-State Circuits. 53:2906-2916
This paper presents a dual-loop two-step ZQ calibration scheme with a 20-nm DRAM process to support dedicated supply voltages ( $V_{DD}$ and $V_{DDQ}$ ). The proposed calibration scheme improves system signal integrity by maintaining the targeted out
Autor:
Hye-Ran Kim, Chul-Sung Park, Kwang-Il Park, Jin-Il Lee, Young-Chul Cho, Jun-Young Park, Chang-Yong Lee, Hyoung-Joo Kim, Ki-Won Lee, Joo Sun Choi, Seong-Jin Jang, Hoe-ju Chung, Jong-ho Lee, Tae-Young Oh, Yong-Cheol Bae, Seung-Hoon Oh, Young-Ryeol Choi, Su-Yeon Doo, Kyung-Soo Ha, Tae-Seong Jang
Publikováno v:
IEEE Journal of Solid-State Circuits. 50:178-190
A 1.0 V 8 Gbit LPDDR4 SDRAM with 3.2 Gbps/pin speed and integrated ECC engine for sub-1 V DRAM core is presented. DRAM internal read-modify-write operation for data masked write makes the integrated ECC engine possible in a commodity DRAM. Time inter
Autor:
Seung-Jun Bae, Jongwook Park, Young-Soo Sohn, Taesung Kim, Sewon Eom, Young-Seok Kim, Hyuck-Joon Kwon, Daesik Moon, Seong-Hwan Kim, Ki-Ho Kim, Seungseob Lee, Eungsung Seo, Jin-Hyeok Baek, Yoon-Joo Eom, Kyoung-Ho Kim, Jung-Hwan Choi, Tae-Young Oh, Gil-Hoon Cha, Seok-Hun Hyun, Yoon-Gyu Song, Youn-sik Park, Kyung-Soo Ha, Young Hoon Son, Dae-Hee Jung, In-Dal Song, Kwang-Il Park, Hyunyoon Cho, Bo-Tak Lim, Chang-Kyo Lee, Si-Hyeong Cho, Joon-Young Park, Junha Lee, Jin-Seok Heo, Young-Ryeol Choi, Seong-Jin Jang
Publikováno v:
A-SSCC
This paper presents a dual-loop 2-step ZQ calibration scheme with 20nm DRAM process to support dedicated supply voltage (VDD, VDDQ). The proposed calibration scheme maintains a target value of on-die termination (ODT) in DQ/CA regardless of the suppl
Autor:
Gil-Shin Moon, Jeong-Don Lim, Hyang-ja Yang, Seung-Jun Bae, Dae Hyun Kim, Hye-Ran Kim, Woo-Seop Kim, Byeong-Cheol Kim, Dong-seok Kang, Cheol-Goo Park, Yong-Ki Cho, Yong-Jae Shin, Yun-Seok Yang, Gong-Heom Han, Young-Soo Sohn, Chang-Ho Shin, Min-Sang Park, Si-Hong Kim, Joo Sun Choi, sunyoung park, Ho-Seok Seol, Kwang-Il Park, Sam-Young Bang, Tae-Young Oh, Young-Ryeol Choi, Su-Yeon Doo, Young-Hyun Jun, Sang-hyup Kwak, Young-Sik Kim
Publikováno v:
ISSCC
Most DRAM interfaces such as GDDR5 and DDR3 use parallel single-ended signaling due to pin-count restriction and backward compatibility. Notwithstanding poor signal and power integrity issues, GDDR5 speed reached beyond 5Gb/s in recent years by utili
Autor:
Tae-Young Oh, Young-Soo Sohn, Seung-Jun Bae, Min-Sang Park, Ji-Hoon Lim, Yong-Ki Cho, Dae-Hyun Kim, Dong-Min Kim, Hye-Ran Kim, Hyun-Joong Kim, Jin-Hyun Kim, Jin-Kook Kim, Young-Sik Kim, Byeong-Cheol Kim, Sang-Hyup Kwak, Jae-Hyung Lee, Jae-Young Lee, Chang-Ho Shin, Yun-Seok Yang, Beom-Sig Cho, Sam-Young Bang, Hyang-Ja Yang, Young-Ryeol Choi, Gil-Shin Moon, Cheol-Goo Park, Seok-Won Hwang, Jeong-Don Lim, Kwang-Il Park, Joo Sun Choi, Young-Hyun Jun
Publikováno v:
2010 IEEE International Solid-State Circuits Conference - (ISSCC).
Autor:
Seung-Jun Bae, Young-Soo Sohn, Tae-Young Oh, Si-Hong Kim, Yun-Seok Yang, Dae-Hyun Kim, Sang-Hyup Kwak, Ho-Seok Seol, Chang-Ho Shin, Min-Sang Park, Gong-Heom Han, Byeong-Cheol Kim, Yong-Ki Cho, Hye-Ran Kim, Su-Yeon Doo, Young-Sik Kim, Dong-Seok Kang, Young-Ryeol Choi, Sam-Young Bang, Sun-Young Park
Publikováno v:
2011 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC); 2011, p498-500, 3p