Výsledky vyhledávání - "Yoshitoki Iijima"

Surface analysis of polyimide bombarded by charged water droplets

Autor: Kenzo Hiraoka, Yoshitoki Iijima, Yuji Sakai

Publikováno v: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 28:510-514

500 eV Ar+ ion impact and the electrospray droplet impact (EDI), in which the charged electrospray water droplets are introduced in vacuum, accelerated and allowed to impact the sample, are applied for etching of polyimide (PI). After the bombardment

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a4e57ca670e7d1bf10f234ae7a13d2ab
https://doi.org/10.1116/1.3420465

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Molecular depth profiling of polystyrene by electrospray droplet impact

Autor: Souichirou Mukou, Yoshitoki Iijima, Kenzo Hiraoka, Yuji Sakai

Publikováno v: Surface and Interface Analysis. 43:167-170

The molecular depth profiling of polymer by the electrospray droplet impact (EDI) has been performed. The multiply charged water droplets with kinetic energy of ∼106 eV were irradiated on the polystyrene spin coated on silicon wafer. With EDI etchi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2f27a0b45250e15e22c70b1aa1e2feae
https://doi.org/10.1002/sia.3490

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Surface analysis of polyvinyl chloride bombarded by Ar+ and charged water droplets

Autor: Yoshitoki Iijima, Kenzo Hiraoka, Yuji Sakai

Publikováno v: Surface and Interface Analysis. 43:236-240

A comparative study of 500 eV Ar + ion impact and the electrospray droplet impact (EDI) applied to polyvinyl chloride (PVC) was made. In EDI, the charged electrospray water droplets are introduced in vacuum, accelerated and allowed to impact the samp

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6d9484a6e5b42b1aa2a42c3fbb782788
https://doi.org/10.1002/sia.3486

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XPS depth profiling of polystyrene etched by electrospray droplet impact

Autor: Yoshitoki Iijima, Daiki Asakawa, Kenzo Hiraoka, Yuji Sakai

Publikováno v: Surface and Interface Analysis. 42:658-661

The molecular-level depth profiling of polystyrene (PS) has been performed by using a newly designed electrospray droplet impact (EDI) gun. The multiple charged water droplets with kinetic energy of ~10 6 eV were irradiated to a bulkand a spin-coated

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ec3a366381e8f8cbd42abf9ceada1633
https://doi.org/10.1002/sia.3254

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Shallow surface etching of organic and inorganic compounds by electrospray droplet impact

Autor: Kunihiko Mori, Kenzo Hiraoka, Yuji Sakai, Yoshitoki Iijima, Daiki Asakawa

Publikováno v: Applied Surface Science. 255:8947-8952

The electrospray droplet impact (EDI) was applied to bradykinin, polyethylene terephthalate (PET), SiO2/Si, and indium phosphide (InP). It was found that bradykinin deposited on the stainless steel substrate was ionized/desorbed without the accumulat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7c6e0a8587b18389ae9b77b326f946c2
https://doi.org/10.1016/j.apsusc.2009.06.101

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Surface characterization of polymethylmetacrylate bombarded by charged water droplets

Autor: Kenzo Hiraoka, Yuji Sakai, Daiki Asakawa, Riou Takaishi, Yoshitoki Iijima

Publikováno v: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 27:748-753

The electrospray droplet impact (EDI), in which the charged electrospray water droplets are introduced in vacuum, accelerated, and allowed to impact the sample, is applied to polymethylmetacrylate (PMMA). The secondary ions generated were measured by

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ae24f83cb26df101f5e31047e99acff0
https://doi.org/10.1116/1.3100219

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X-ray photoelectron spectroscopy analysis of organic materials etched by charged water droplet impact

Autor: Daiki Asakawa, Kenzo Hiraoka, Yoshitoki Iijima, Riou Takaishi, Yuji Sakai

Publikováno v: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 27:743-747

Electrospray droplet impact (EDI) has been developed for matrix-free secondary ion mass spectrometry for surface analysis. When a target is etched by EDI, the physical etching on the target is suppressed to minimal, i.e., the occurrence of shallow su

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5046d3a79719a6cebfe6513bcecd1296
https://doi.org/10.1116/1.3077283

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