Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Yoonseo Jang"'
Publikováno v:
Journal of Alloys and Compounds. 922:166197
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e92dda328b5a4037b1faa96cc35cd96
https://doi.org/10.1016/j.jallcom.2022.166197
https://doi.org/10.1016/j.jallcom.2022.166197
Publikováno v:
Applied Surface Science. 600:154103
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f7c1b6f3022354e534c5d8ca4435706
https://doi.org/10.1016/j.apsusc.2022.154103
https://doi.org/10.1016/j.apsusc.2022.154103
Autor:
Jae-Hyun Ryou, Eric S. Larsen, Hyun-Seop Kim, Seung Min Lee, Jungwoo Oh, Weijie Wang, Jung Hwan Yum, Jongho Jung, Christopher W. Bielawski, Ho-Young Cha, Yoonseo Jang
Publikováno v:
Applied Surface Science. 469:634-640
For the first time, an epitaxial beryllium oxide (BeO) film was grown on 4H silicon carbide (4H-SiC) by atomic layer deposition (ALD) at a low temperature of 250 °C. The BeO film had a large lattice mismatch with the substrate (>7–8%), but it was
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b08d4b2294d6db0dfc4b0a6f2dc89570
https://doi.org/10.1016/j.apsusc.2018.09.239
https://doi.org/10.1016/j.apsusc.2018.09.239
Autor:
Jungwoo Oh, Christopher W. Bielawski, Yoonseo Jang, Prakash R. Sultane, Dohwan Jung, Eric S. Larsen
Publikováno v:
Applied Surface Science. 572:151405
Beryllium oxide (BeO) is a unique metal oxide that exhibits high thermal conductivity and a high dielectric constant, even though it has a large bandgap energy. These characteristics can potentially address the electromagnetic issues associated with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15e4b644aa72bc03c01a9103b872ce51
https://doi.org/10.1016/j.apsusc.2021.151405
https://doi.org/10.1016/j.apsusc.2021.151405
Autor:
Do Hwan Jung, Christopher W. Bielawski, Yoonseo Jang, Seonno Yoon, Jungwoo Oh, Jung Hwan Yum, Eric S. Larsen, Seung Min Lee
Publikováno v:
Applied Surface Science. 505:144107
In this study, we demonstrated the band alignment between a BeO and AlGaN/GaN heterointerface. The bandgap of the BeO film was measured to be 8.2 ± 0.05 eV by reflection electron energy loss spectroscopy. A valence band offset of the BeO/AlGaN inter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b561a27bdefd6bbd025b2de96010706
https://doi.org/10.1016/j.apsusc.2019.144107
https://doi.org/10.1016/j.apsusc.2019.144107
Autor:
Seung Min Lee, Jungwoo Oh, Christopher W. Bielawski, Yoonseo Jang, Eric S. Larsen, Jung Hwan Yum, Do Hwan Jung
Publikováno v:
Solid-State Electronics. 163:107661
Beryllium oxide (BeO) thin films were grown on a p-type Si substrate by plasma enhanced atomic layer deposition (PEALD) using diethylberyllium as a precursor and O2 plasma. The PEALD BeO exhibited self-saturation and linear growth rates. The dielectr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74c4932aab49b0b503cb3cb8f075bd5f
https://doi.org/10.1016/j.sse.2019.107661
https://doi.org/10.1016/j.sse.2019.107661
Autor:
Jungwoo Oh, Woo Chul Lee, Christopher W. Bielawski, Yoonseo Jang, Seong Keun Kim, Jung Hwan Yum, Eric S. Larsen, Seung Min Lee
Publikováno v:
Semiconductor Science and Technology. 34:115021
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60156fdbc33036e03c65e13824757636
https://doi.org/10.1088/1361-6641/ab4824
https://doi.org/10.1088/1361-6641/ab4824
Autor:
Seung Min Lee, Yoonseo Jang, Jung Hwan Yum, Eric S Larsen, Woo Chul Lee, Seong Keun Kim, Christopher W Bielawski, Jungwoo Oh
Publikováno v:
Semiconductor Science & Technology; Nov2019, Vol. 34 Issue 11, p1-1, 1p