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pro vyhledávání: '"Yongmin Seong"'
Autor:
Yongmin Seong, Seungjoo Woo, Sungsoo Chung, Kiseog Kim, Yunho Kang, Youngboo Kim, Dongwoo Bae, Joongsik Kih
Publikováno v:
2021 IEEE Region 10 Symposium (TENSYMP).
Neutron induced single event failure mechanism in commercial SiC Schottky diode was researched with Single-Event Burnout(SEBO) radiation test equipment and precise fluence correlation and correction system. To evaluate and quantify the diode immunity
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::955f80abce860e9b5236a84a373df42f
https://doi.org/10.1109/tensymp52854.2021.9550836
https://doi.org/10.1109/tensymp52854.2021.9550836
