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pro vyhledávání: '"Yongju Jang"'
Publikováno v:
KIISE Transactions on Computing Practices. 27:376-381
Publikováno v:
International Conference on Extreme Ultraviolet Lithography 2018.
Extreme ultraviolet lithography (EUVL) has received a considerable attention in the semiconductor industry as a promising candidate to achieve the high resolution pattern beyond 10nm. To achieve it, pellicle is essential to prevent the reticle from p
Publikováno v:
Proceedings of SPIE; 8/25/2018, Vol. 10809, p108090R-1-108090R-4, 4p