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pro vyhledávání: '"Yonghwan Ahn"'
Autor:
Seunghwan Lee, Seungjoon Eom, Jinsu Jeong, Junjong Lee, Sanguk Lee, Hyeok Yun, Yonghwan Ahn, Rock-Hyun Baek
Publikováno v:
IEEE Access, Vol 12, Pp 184619-184628 (2024)
We present a novel multi-task learning (MTL) approach with shared representation for the real-time extraction of Berkeley Short-channel IGFET Model-Common Gate (BSIM-CMG) parameters in nanosheet field-effect transistors (NSFETs) with multiple structu
Externí odkaz:
https://doaj.org/article/e45b9ce020794694a8efa134ebbd1964
