Zobrazeno 1 - 10 of 52 pro vyhledávání: '"Yong-Duck Kim"'
1
Akademický článek
Highly Uniform Low Gray AMOLED Pixel Using Stable Circuit and Duty Ratio Modulation Driving
Autor: Chanjin Park, Hee-Ok Kim, Jong-Heon Yang, Jae-Eun Pi, Yong-Duck Kim, Chun-Won Byun, Kyeong-Soo Kang, Ji-Hwan Park, Minji Kim, Hyoungsik Nam, Soo-Yeon Lee
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 12, Pp 668-676 (2024)
In this paper, a new pixel circuit for active matrix organic light-emitting diode (AMOLED) display that can achieve high uniformity in low gray levels and its driving method are proposed. The proposed circuit compensates for threshold voltage variati
Externí odkaz: https://doaj.org/article/c849a354d8084be7b5b3a083ef9068bc
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4
Effects of Tensile Strain on Dynamic and Static Inverters Using Amorphous Indium-Gallium-Zinc-Oxide TFTs
Autor: W.M. Lee, Ki-Lim Han, Yong-Duck Kim, Jong-Il Lee, Jun-Hyeok Kim, Byong-Deok Choi, Jin-Seong Park
Publikováno v: IEEE Electron Device Letters. 42:359-362
The dynamic inverter using amorphous indium-gallium-zinc oxide thin-film transistors (a-IGZO TFTs) is revealed to be more robust to tensile strain than the static inverter that is most widely used in TFT circuits. The results with the inverters can b
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ebbaeba29a9a6641608d388fcdc67676
https://doi.org/10.1109/led.2021.3053777
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5
A Physical Unclonable Function With Bit Error Rate < 2.3 $\times$ 10−8 Based on Contact Formation Probability Without Error Correction Code
Autor: Duhyun Jeon, Byong-Deok Choi, Yong-Duck Kim, Dong Kyue Kim, Jong Hak Baek, Jae-Seong Lee
Publikováno v: IEEE Journal of Solid-State Circuits. 55:805-816
This article proposes a physical unclonable function (PUF) based on the contact formation probability. The contact here is the interconnect layer between the metal and the silicon in a chip. As the contact is designed smaller than the size given in t
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e6ee3e134d52b1b9c03d872ea6c50c8d
https://doi.org/10.1109/jssc.2019.2951415
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6
Electrical Stability Analysis of Dynamic Logic Using Amorphous Indium–Gallium–Zinc-Oxide TFTs
Autor: Byong-Deok Choi, Jin-Seong Park, Yong-Duck Kim, Jong-Seok Kim, Ki-Lim Han, Jong-Il Lee, Beom Su Kim
Publikováno v: IEEE Electron Device Letters. 40:1128-1131
Prior research has reported that the device characteristics of amorphous indium–gallium–zinc-oxide (a-IGZO) thin-film transistors (TFTs) have been changed by instabilities due to electrical stress. Because positive bias stress and high current st
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a999970467b551561d22b82881207aa1
https://doi.org/10.1109/led.2019.2920634
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7
A High-Reliability Carry-Free Gate Driver for Flexible Displays Using a-IGZO TFTs
Autor: Jung-Woo Byun, Jin-Seong Park, Byong-Deok Choi, Yong-Duck Kim, Ki-Lim Han, Jun-Hwan Jang, Jong-Seok Kim
Publikováno v: IEEE Transactions on Electron Devices. 65:3269-3276
Most thin-film transistor (TFT) gate drivers integrated on the display panel use the carry signals between the stages. In our previous works, we found that these carry-type gate drivers are subject to the reliability problem in a flexible display, si
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4dddd1dcbd1f5596943e110e6c8dacb3
https://doi.org/10.1109/ted.2018.2843180
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8
Akademický článek
Mechanical Durability of Flexible/Stretchable a-IGZO TFTs on PI Island for Wearable Electronic Application.
Autor: Ki-Lim Han, Won-Bum Lee, Yong-Duck Kim, Jun-Hyeok Kim, Byong-Deok Choi, Jin-Seong Park
Publikováno v: ACS Applied Electronic Materials; 11/23/2021, Vol. 3 Issue 11, p5037-5047, 11p
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