Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Yong Hyeon Yi"'
Autor:
Valeriy Sukharev, Armen Kteyan, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Jun-Ho Choy, Sofya Torosyan, Yu Zhu
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4837-4850
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ba0c400adef4598b99f0736184dd460
https://doi.org/10.1109/tcad.2021.3134886
https://doi.org/10.1109/tcad.2021.3134886
Autor:
Armen Kteyan, Valeriy Sukharev, Alexander Volkov, Jun Ho Choy, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Stephane Moreau
Publikováno v:
ISPD '23: Proceedings of the 2023 International Symposium on Physical Design
ISPD'23-International Symposium on Physical Design
ISPD'23-International Symposium on Physical Design, Mar 2023, Virtual event USA, United States. pp.124-132
ISPD'23-International Symposium on Physical Design
ISPD'23-International Symposium on Physical Design, Mar 2023, Virtual event USA, United States. pp.124-132
International audience; A recently proposed methodology for electromigration (EM) assessment in on-chip power/ground grid of integrated circuits has been validated by means of measurements, performed on dedicated test grids. IR drop degradation in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4c87e664502295538e2be9edfcb68855
https://doi.org/10.1145/3569052.3578922
https://doi.org/10.1145/3569052.3578922
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3bf022d113beac8188acce9a74932e5
https://doi.org/10.1109/irps48203.2023.10117811
https://doi.org/10.1109/irps48203.2023.10117811