Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Yoichiro Iwagami"'
Autor:
Hidenori Okuni, Yoshinari Ojima, Akihide Sai, Kentaro Yoshioka, Hirotomo Ishii, Masatoshi Hirono, Hiroshi Kubota, Matsumoto Nobu, Yasuhiro Ishii, Satoshi Kondo, Seitaro Yagi, Sohichiroh Hosoda, Yoshikazu Nagashima, Naoya Waki, Ta Tuan Thanh, Yumi Higashi, Tomohiko Sugimoto, Tomonori Fukushima, Isao Fujisawa, Tomohiro Koizumi, Yutaka Ota, Naoyuki Kawabe, Nobuo Kano, Daisuke Kurose, K. Watanabe, Yoichiro Iwagami, Katsuyuki Kimura, Tetsuya Nakamura
Publikováno v:
IEEE Journal of Solid-State Circuits. 53:3026-3038
This paper presents a time-to-digital converter/analog-to-digital-converter (TDC/ADC) hybrid LiDAR system-on-chip (SoC) to realize reliable self-driving systems. The smart accumulation technique (SAT) is proposed to achieve both 200-m and high-pixel-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76a3f7131bb9885182b7c5d7d6e2e85b
https://doi.org/10.1109/jssc.2018.2868315
https://doi.org/10.1109/jssc.2018.2868315
Autor:
Kentaro Yoshioka, Yasuhiro Ishii, Naoyuki Kawabe, Hirotomo Ishii, Seitaro Yagi, Naoya Waki, K. Watanabe, Ta Tuan Thanh, Yoichiro Iwagami, Yutaka Oota, Tomohiro Sugimoto, Matsumoto Nobu, Yoshinari Ojima, Tomohiro Koizumi, Hidenori Okuni, Satoshi Kondo, Katsuyuki Kimura, Sohichiroh Hosoda, Nobuo Kano, Yumi Higashi, Akihide Sai, Daisuke Kurose, Tetsuya Nakamura, Yoshikazu Nagashima, Hiroshi Kubota, Tomonori Fukushima, Isao Fujisawa
Publikováno v:
ISSCC
Long-range and high-pixel-resolution LiDAR systems, using Time-of-Flight (ToF) information of the reflected photon from the target, are essential upon launching safe and reliable self-driving programs of Level 4 and above. 200m long-range distance me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::481e6bfef140110356ce52444a3d551d
https://doi.org/10.1109/isscc.2018.8310199
https://doi.org/10.1109/isscc.2018.8310199
Autor:
Takeshi Takamiya, Takayuki Mihara, Yoshimasa Aoyama, Hiroki Muroga, Naoki Sugawa, Hiroshi Doi, Tadashi Yabuta, Yoichiro Iwagami, Naohiko Okamoto, Kazuki Iwata, Kenichi Ishii
Publikováno v:
2005 IEEE Hot Chips XVII Symposium (HCS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2548f355fe03ecea1dc30124e6033769
https://doi.org/10.1109/hotchips.2005.7476578
https://doi.org/10.1109/hotchips.2005.7476578
Autor:
Yoshioka, Kentaro, Kubota, Hiroshi, Fukushima, Tomonori, Kondo, Satoshi, Ta, Tuan Thanh, Okuni, Hidenori, Watanabe, Kaori, Hirono, Masatoshi, Ojima, Yoshinari, Kimura, Katsuyuki, Hosoda, Sohichiroh, Ota, Yutaka, Koizumi, Tomohiro, Kawabe, Naoyuki, Ishii, Yasuhiro, Iwagami, Yoichiro, Yagi, Seitaro, Fujisawa, Isao, Kano, Nobuo, Sugimoto, Tomohiko
Publikováno v:
IEEE Journal of Solid-State Circuits; Nov2018, Vol. 53 Issue 11, p3026-3038, 13p