Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Yogeswara Rao Golive"'
Publikováno v:
Solar Energy. 237:203-212
Publikováno v:
Progress in Photovoltaics: Research and Applications. 30:1087-1100
Publikováno v:
2022 IEEE International Conference on Emerging Electronics (ICEE).
Publikováno v:
Progress in Photovoltaics: Research and Applications. 30:13-26
Autor:
Rajiv Dubey, Sonali Bhaduri, Juzer Vasi, Yogeswara Rao Golive, Birinchi Bora, Narendra Shiradkar, Shashwata Chattopadhyay, Hemant Kumar Singh, Sachin Zachariah, Anil Kottantharayil, A. K. Tripathi, Sanjeev Kumar
Publikováno v:
IEEE Journal of Photovoltaics. 10:560-567
The analysis of performance degradation in photovoltaic (PV) modules with c-Si technologies as observed in the All-India Survey of PV Module Reliability 2018 is presented in this article. The degradation rates are correlated with the module age, syst
Autor:
Deepanshu Koshta, Anil Kottantharayil, Yogeswara Rao Golive, Juzer Vasi, Narendra Shiradkar, Karan Rane
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Simulation models for I-V characteristics of PV modules under mismatch conditions often assume ideal bypass diode and ignore the reverse leakage current of cells. In this paper, we present a SPICE based model in which customized reverse leakage curre
Autor:
Yogeswara Rao Golive, Narendra Shiradkar, K Naga Bhavya Jyothi, Brij M. Arora, K. L. Narasimhan, Deepanshu Koshta
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Establishing short circuit condition for a cell in a module is an essential prerequisite for measuring the quantum efficiency of a solar cell. A PV module consists of cells in series and also has bypass diodes across strings. To measure the quantum e
Autor:
Narendra Shiradkar, Sachin Zachariah, Juzer Vasi, Rajiv Dubey, Shashwata Chattopadhyay, Hemant Kumar Singh, Anil Kottantharayil, Yogeswara Rao Golive, Sonali Bhaduri
Publikováno v:
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
The analysis of degradation observed in some highly degraded photovoltaic (PV) modules inspected during the 2018 All India Survey of PV Module Reliability is presented. The influence of parameters like age, climatic zone of deployment, type of mounti
Autor:
Anil Kottantharayil, Narendra Shiradkar, Juzer Vasi, Hemant Kumar Singh, Yogeswara Rao Golive
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
This paper presents a simulation study to estimate the accuracy of various STC correction procedures as a function of irradiance and temperature in field. The normalized errors in maximum power (P max ) in STC correction for the IEC 60891 Procedure 1
Autor:
Yogeswara Rao Golive, Anil Kottantharayil, Ritesh Ingle, Rajiv Dubey, Sachin Zachariah, Hemant Kumar Singh, Narendra Shiradkar, Shashwata Chattopadhyay, Sonali Bhaduri, Sudhanshu Mallick, Ali Asger Khattab, Juzer Vasi
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
This paper presents analysis of Infrared (IR) imaging performed on a total of 793 modules inspected during the All India Survey of PV Module Reliability 2018. It 18% of the inspected modules had Module ΔT (difference between maximum and modal temper