Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Yogeesh MN"'
Autor:
Wu D; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States., Li W; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Rai A; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Wu X; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Yogeesh MN; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Chu Z; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Akinwande D; Microelectronics Research Center, Department of Electrical and Computer Engineering , The University of Texas at Austin , Austin , Texas 78758 , United States., Lai K; Department of Physics , The University of Texas at Austin , Austin , Texas 78712 , United States.
Publikováno v:
Nano letters [Nano Lett] 2019 Mar 13; Vol. 19 (3), pp. 1976-1981. Date of Electronic Publication: 2019 Feb 21.
Autor:
Wu Z; Department of Mechanical Engineering, Materials Science and Engineering Program, and Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, USA. zheng@austin.utexas.edu., Kelp G; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA., Yogeesh MN; Microelectronics Research Centre, The University of Texas at Austin, Austin, Texas 78758, USA., Li W; Microelectronics Research Centre, The University of Texas at Austin, Austin, Texas 78758, USA., McNicholas KM; Microelectronics Research Centre, The University of Texas at Austin, Austin, Texas 78758, USA., Briggs A; Microelectronics Research Centre, The University of Texas at Austin, Austin, Texas 78758, USA., Rajeeva BB; Department of Mechanical Engineering, Materials Science and Engineering Program, and Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, USA. zheng@austin.utexas.edu., Akinwande D; Microelectronics Research Centre, The University of Texas at Austin, Austin, Texas 78758, USA., Bank SR; Microelectronics Research Centre, The University of Texas at Austin, Austin, Texas 78758, USA., Shvets G; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA., Zheng Y; Department of Mechanical Engineering, Materials Science and Engineering Program, and Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, USA. zheng@austin.utexas.edu.
Publikováno v:
Nanoscale [Nanoscale] 2016 Nov 03; Vol. 8 (43), pp. 18461-18468.
Autor:
Wu D; Department of Physics, University of Texas at Austin, Austin, TX 78712;, Li X; Department of Physics, University of Texas at Austin, Austin, TX 78712;, Luan L; Department of Physics, University of Texas at Austin, Austin, TX 78712;, Wu X; Department of Physics, University of Texas at Austin, Austin, TX 78712;, Li W; Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758., Yogeesh MN; Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758., Ghosh R; Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758., Chu Z; Department of Physics, University of Texas at Austin, Austin, TX 78712;, Akinwande D; Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758., Niu Q; Department of Physics, University of Texas at Austin, Austin, TX 78712;, Lai K; Department of Physics, University of Texas at Austin, Austin, TX 78712; kejilai@physics.utexas.edu.
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America [Proc Natl Acad Sci U S A] 2016 Aug 02; Vol. 113 (31), pp. 8583-8. Date of Electronic Publication: 2016 Jul 21.
Autor:
Zhu W; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Park S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Yogeesh MN; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., McNicholas KM; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Bank SR; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Akinwande D; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States.
Publikováno v:
Nano letters [Nano Lett] 2016 Apr 13; Vol. 16 (4), pp. 2301-6. Date of Electronic Publication: 2016 Mar 18.
Autor:
Chang HY; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA., Yogeesh MN; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA., Ghosh R; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA., Rai A; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA., Sanne A; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA., Yang S; Department of Aerospace Engineering and Engineering Mechanics, The University of Texas at Austin, Austin, TX, 78712, USA., Lu N; Department of Aerospace Engineering and Engineering Mechanics, The University of Texas at Austin, Austin, TX, 78712, USA., Banerjee SK; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA., Akinwande D; Microelectronics Research Center, The University of Texas at Austin, Austin, TX, 78758, USA.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2016 Mar 02; Vol. 28 (9), pp. 1818-23. Date of Electronic Publication: 2015 Dec 28.
Autor:
Lin L; Department of Mechanical Engineering, The University of Texas at Austin , Austin, Texas 78712, United States.; Materials Science & Engineering Program and Texas Materials Institute, The University of Texas at Austin , Austin, Texas 78712, United States., Peng X; Materials Science & Engineering Program and Texas Materials Institute, The University of Texas at Austin , Austin, Texas 78712, United States., Mao Z; Department of Engineering Science and Mechanics, The Pennsylvania State University , University Park, Pennsylvania 16802, United States., Li W; Materials Science & Engineering Program and Texas Materials Institute, The University of Texas at Austin , Austin, Texas 78712, United States.; Microelectronics Research Centre, The University of Texas at Austin , Austin, Texas 78758, United States., Yogeesh MN; Microelectronics Research Centre, The University of Texas at Austin , Austin, Texas 78758, United States., Rajeeva BB; Materials Science & Engineering Program and Texas Materials Institute, The University of Texas at Austin , Austin, Texas 78712, United States., Perillo EP; Department of Biomedical Engineering, The University of Texas at Austin , Austin, Texas 78712, United States., Dunn AK; Department of Biomedical Engineering, The University of Texas at Austin , Austin, Texas 78712, United States., Akinwande D; Materials Science & Engineering Program and Texas Materials Institute, The University of Texas at Austin , Austin, Texas 78712, United States.; Microelectronics Research Centre, The University of Texas at Austin , Austin, Texas 78758, United States., Zheng Y; Department of Mechanical Engineering, The University of Texas at Austin , Austin, Texas 78712, United States.; Materials Science & Engineering Program and Texas Materials Institute, The University of Texas at Austin , Austin, Texas 78712, United States.
Publikováno v:
Nano letters [Nano Lett] 2016 Jan 13; Vol. 16 (1), pp. 701-8. Date of Electronic Publication: 2015 Dec 22.
Autor:
Sanne A; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Ghosh R; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Rai A; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Yogeesh MN; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Shin SH; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Sharma A; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Jarvis K, Mathew L; §Applied Novel Devices Inc., Austin, Texas 78717, United States., Rao R; §Applied Novel Devices Inc., Austin, Texas 78717, United States., Akinwande D; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States., Banerjee S; †Microelectronics Research Center and ‡Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States.
Publikováno v:
Nano letters [Nano Lett] 2015 Aug 12; Vol. 15 (8), pp. 5039-45. Date of Electronic Publication: 2015 Jul 08.
Autor:
Zhu W; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin , Austin, Texas 78758, United States., Yogeesh MN, Yang S, Aldave SH, Kim JS, Sonde S, Tao L, Lu N, Akinwande D
Publikováno v:
Nano letters [Nano Lett] 2015 Mar 11; Vol. 15 (3), pp. 1883-90. Date of Electronic Publication: 2015 Mar 02.