Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Yiu Wai Lai"'
Publikováno v:
Science and Technology of Advanced Materials, Vol 12, Iss 5, p 054201 (2011)
A high-throughput characterization technique based on digital holography for mapping film thickness in thin-film materials libraries was developed. Digital holographic microscopy is used for fully automatic measurements of the thickness of patterned
Externí odkaz:
https://doaj.org/article/9eb5839d99fe4c9e9a865ee18994fcc0
Autor:
Robert Meyer, S. Hamann, Klaus Hackl, Martin R. Hofmann, Nektarios Koukourakis, Alfred Ludwig, E Darakis, Yiu Wai Lai, M Ehmann, Nils C. Gerhardt
Publikováno v:
Journal of Microelectromechanical Systems. 19:1175-1179
An investigation on the integrity of micro-hotplates using in situ digital holographic microscopy is reported. The surface topography and surface evolution of the devices during high-temperature operation (heating/cooling cycles) is measured with nan
Autor:
Tilmann Leisegang, Dirk C. Meyer, R. Träger, Oliver Gutfleisch, N. Scheerbaum, Jeffrey McCord, Michael R. Thomas, Yiu-Wai Lai, Sebastian Fähler, Ludwig Schultz, K. Khlopkov, Jian Liu
Publikováno v:
Acta Materialia. 58:4629-4638
The capability of showing large magnetically induced strains (MFIS) up to ∼10% has attracted considerable research interest to magnetic shape memory (MSM) alloys. The prototype MSM alloy is the ternary Ni2MnGa. In this work, a comprehensive study o
Autor:
Michael R. Thomas, Yiu Wai Lai, S. Kaufmann, Ludwig Schultz, Sebastian Fähler, Oleg Heczko, Jeffrey McCord, Jörg Buschbeck
Publikováno v:
Advanced Materials. 21:3708-3711
Publikováno v:
Acta Materialia. 56:5130-5137
The actuation performance and twin-boundary velocity in bulk NiMnGa magnetic shape memory single crystals at various frequencies are investigated. A dynamic actuation experimental setup with the ability to apply mechanical stress and a high-frequency
Autor:
Yiu Wai Lai, Joshua E.-Y. Lee
Publikováno v:
NEMS
Metal resistive heater on dielectric membrane structures are common in MEMS. In this paper, the evolution of the surface topography of this type of structure during operation is studied by in situ digital holographic microscopy with nanometer-scale r
Autor:
Michael Krause, Alan Savan, Yiu Wai Lai, Alfred Ludwig, Martin R. Hofmann, Nektarios Koukourakis, Sigurd Thienhaus
Publikováno v:
Science and technology of advanced materials. 12(5)
A high-throughput characterization technique based on digital holography for mapping film thickness in thin-film materials libraries was developed. Digital holographic microscopy is used for fully automatic measurements of the thickness of patterned
Publikováno v:
Frontiers in Optics 2010/Laser Science XXVI.
We use photorefractive two-wave mixing gain for coherent amplification in digital holography. This enables the reconstruction of amplitude and phase images that are not detectable otherwise, leading to an enhanced dynamic range.
Publikováno v:
SPIE Proceedings.
In this paper, the authors present a new low-level birefringence detection (LLBD) system using photoelastic modulation technology. The LLBD system, operating at wavelength 1152 nm, determines point-by-point the magnitude and orientation (angle of fas
Autor:
Yiu Wai Lai, Carsten Brenner, Nektarios Koukourakis, Nils C. Gerhardt, Tarek Abdelwahab, Martin R. Hofmann, Ming Yuan Li, Henning Höpfner, Emmanouil Darakis
Publikováno v:
Optics Express. 19:22004
We use photorefractive two-wave mixing for coherent amplification of the object beam in digital holographic recording. Both amplitude and phase reconstruction benefit from the prior amplification as they have an increased SNR. We experimentally verif