Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Yisen Fang"'
Publikováno v:
IEEE Access, Vol 8, Pp 31371-31397 (2020)
The ageing phenomenon of negative bias temperature instability (NBTI) continues to challenge the dynamic thermal management of modern FPGAs. Increased transistor density leads to thermal accumulation and propagates higher and non-uniform temperature
Externí odkaz:
https://doaj.org/article/6e89eb14aa414942b73f70863b919fba
The ageing phenomenon of negative bias temperature instability (NBTI) continues to challenge the dynamic thermal management of modern FPGAs. Increased transistor density leads to thermal accumulation and propagates higher and non-uniform temperature
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::56cc7d3e091104e86b19ee533115c461
https://dspace.lib.cranfield.ac.uk/handle/1826/15249
https://dspace.lib.cranfield.ac.uk/handle/1826/15249
