Zobrazeno 1 - 10
of 114
pro vyhledávání: '"Yiorgos Tsiatouhas"'
Autor:
Simon-Ilias Poulis, Georgios Papatheodorou, Christoforos Papaioannou, Yiorgos Sfikas, Marina E. Plissiti, Aristides Efthymiou, John Liaperdos, Yiorgos Tsiatouhas
Publikováno v:
Technologies, Vol 10, Iss 1, p 36 (2022)
Visible light communication (VLC) is an upcoming wireless communication technology. In a VLC system, signal integrity under low illumination intensity and high transmission frequencies are of great importance. Towards this direction, the performance
Externí odkaz:
https://doaj.org/article/ce6bfb6fb41947b58f8159331c2ee5cc
Publikováno v:
Integration. 88:108-115
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf70795555a62013f1075b67d30afa14
https://doi.org/10.1016/j.vlsi.2022.09.009
https://doi.org/10.1016/j.vlsi.2022.09.009
Autor:
Georgios Megas, Georgios Papatheodorou, Yiorgos Sfikas, Aristides Efthymiou, Yiorgos Tsiatouhas
Publikováno v:
2022 Panhellenic Conference on Electronics & Telecommunications (PACET).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7f26bca129bab6f75eb84c27020d136
https://doi.org/10.1109/pacet56979.2022.9976367
https://doi.org/10.1109/pacet56979.2022.9976367
Publikováno v:
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::baeae9171e18771b689c373493b767a4
https://doi.org/10.1109/vlsi-soc54400.2022.9939570
https://doi.org/10.1109/vlsi-soc54400.2022.9939570
Publikováno v:
2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a4c32d979b9ff92b39d80317d32fa17
https://doi.org/10.1109/mocast54814.2022.9837768
https://doi.org/10.1109/mocast54814.2022.9837768
Autor:
Christoforos Papaioannou, Marina E. Plissiti, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas
Publikováno v:
2022 IEEE International Black Sea Conference on Communications and Networking (BlackSeaCom).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8970d4bf2ad16e510db56f55983ab99c
https://doi.org/10.1109/blackseacom54372.2022.9858232
https://doi.org/10.1109/blackseacom54372.2022.9858232
Publikováno v:
Journal of Electronic Testing. 37:191-203
Through Silicon Vias (TSVs) are crucial elements for the reliable operation and yield of three dimensional integrated circuits (3D ICs). Defects are a serious concern in TSV structures. A post-bond, parallel testing and diagnosis scheme is proposed i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b41691e216ea2c5a10e4599128577710
https://doi.org/10.1007/s10836-021-05939-z
https://doi.org/10.1007/s10836-021-05939-z
Publikováno v:
Journal of Electronic Testing. 37:65-82
Serious reliability concerns of Static Random Access Memories (SRAMs) in nanometer technologies are the increased process variations as well as the various aging mechanisms. Bias Temperature Instability (BTI) and Hot Carrier Injection (HCI) phenomena
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e32cdac509d1de179b0cb6d077801648
https://doi.org/10.1007/s10836-021-05932-6
https://doi.org/10.1007/s10836-021-05932-6
Autor:
Marina E. Plissiti, Christoforos Papaioannou, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas
Publikováno v:
2021 IEEE International Mediterranean Conference on Communications and Networking (MeditCom).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d35fea3cdb99cb3e2fef4bc8a1053d8e
https://doi.org/10.1109/meditcom49071.2021.9647560
https://doi.org/10.1109/meditcom49071.2021.9647560
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 19:64-72
Transistor bias-temperature instability (BTI) effects are a serious reliability concern in nanometer technology static random access memories (SRAMs). In this paper, a methodology and a circuit for the periodic monitoring of BTI induced aging in SRAM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ffe44e0861ffc250de16c81a8bce6d63
https://doi.org/10.1109/tdmr.2019.2898862
https://doi.org/10.1109/tdmr.2019.2898862