Zobrazeno 1 - 10
of 44
pro vyhledávání: '"Yingtao Xie"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 11, Pp 717-725 (2023)
In this work, two approaches of forward design neural network and reverse design neural network were proposed to accelerate the design of passivation-layer structured amorphous indium gallium zinc oxide thin-film transistor (a-IGZO TFT). It was based
Externí odkaz:
https://doaj.org/article/52fd0896adaa4613ad5b70919cdb9c6a
Publikováno v:
IEEE Access, Vol 7, Pp 162756-162767 (2019)
Code reuse has been perceived to be an effective tool for user interface development that is known to be complex and messy. A fundamental problem in user interface code reuse is how to effectively retrieve working code from existing code repositories
Externí odkaz:
https://doaj.org/article/a2ac9dabf4374a4d87fffa93317ecb0e
Autor:
Amos Hamukale, Tadatsugu Imamura, Muzala Kapina, Olena Borkovska, Chisenga Abel Musuka, Emmanuel Tembo, Yingtao Xie, Carmen Tedesco, Paul Msanzya Zulu, Patrick Sakubita, Fred Kapaya, Raymond Hamoonga, Mazyanga Mazaba Liwewe, Chie Nagata, Akira Ishiguro, Nathan Kapata, Victor Mukonka, Nyambe Sinyange
Publikováno v:
Pan African Medical Journal. 45
Publikováno v:
2022 IEEE International Flexible Electronics Technology Conference (IFETC).
Publikováno v:
SID Symposium Digest of Technical Papers. 52:1100-1103
Autor:
Hamukale, Amos, Tadatsugu Imamura, Kapina, Muzala, Borkovska, Olena, Musuka, Chisenga Abel, Tembo, Emmanuel, Yingtao Xie, Tedesco, Carmen, Zulu, Paul Msanzya, Sakubita, Patrick, Kapaya, Fred, Hamoonga, Raymond, Mazaba, Mazyanga Lucy, Nagata, Chie, Ishiguro, Akira, Kapata, Nathan, Mukonka, Victor, Sinyange, Nyambe
Publikováno v:
Pan African Medical Journal; May-Aug2023, Vol. 45, p1-10, 10p
Publikováno v:
Journal of Materials Science. 55:15908-15918
A facile silver metallo-organic decomposition (MOD) ink and its two-step sintering process was developed to fabricate highly conductive and smooth silver film for the flexible organic electronics. Using simple and feasible two-step sintering processe
Publikováno v:
Microelectronics Journal. 127:105520
Publikováno v:
Knowledge-Based Systems. 250:108975
Publikováno v:
Semiconductor Science and Technology. 37:045005
In this work, based on the channel damage caused by source/drain etching and passivation-layer deposition, the effects of the passivation-layer process on amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs) devices were studied by combining exper