Zobrazeno 1 - 10
of 54
pro vyhledávání: '"Yindi CAI"'
Publikováno v:
Applied Sciences, Vol 12, Iss 12, p 6064 (2022)
A miniature laser diode interferometer (MLDI), which can be embedded in precision machines or measurement equipment as an on-line measurement sensor, is designed. A compact laser diode (LD) is adopted as the laser source of the MLDI. The measurement
Externí odkaz:
https://doaj.org/article/508bc55ee3444aff8fe27c07c73b304c
Publikováno v:
Applied Sciences, Vol 12, Iss 7, p 3479 (2022)
Active methods are proposed to improve the measurement accuracy of a compact laser diode-based (LD-based) system, which is designed to measure the geometric errors of machine tools. The LD has some advantages, such as a small size, low cost and high
Externí odkaz:
https://doaj.org/article/fc302fd9bb1e45d2b533d46066ddba91
Autor:
Dong Wook Shin, Lue Quan, Yuki Shimizu, Hiraku Matsukuma, Yindi Cai, Eberhard Manske, Wei Gao
Publikováno v:
Applied Sciences, Vol 11, Iss 17, p 8028 (2021)
Major modifications are made to the setup and signal processing of the method of in-situ measurement of the pitch of a diffraction grating based on the angles of diffraction of the diffracted optical frequency comb laser emanated from the grating. In
Externí odkaz:
https://doaj.org/article/65ec86889b664bdfaa70db7c584f6b2c
Publikováno v:
Applied Sciences, Vol 11, Iss 10, p 4705 (2021)
Attempts are made in this paper to improve the quality of the stitching between adjacent arc-profiles in the stitching linear-scan method for the roundness measurement of a cylinder in a small dimension. The data in the edge region of an arc-profile,
Externí odkaz:
https://doaj.org/article/70f83aabc1d946a0baef4f47fefdf148
Publikováno v:
Applied Sciences, Vol 10, Iss 14, p 4799 (2020)
This paper presents a measurement method for high-precision cutting edge radius of single point diamond tools using an atomic force microscope (AFM) and a reverse cutting edge artifact based on the edge reversal method. Reverse cutting edge artifact
Externí odkaz:
https://doaj.org/article/542dfa5ff9ac4838aae6dcecdc5c7ef9
Publikováno v:
Sensors, Vol 19, Iss 20, p 4587 (2019)
A low-cost miniature homodyne interferometer (MHI) with self-wavelength correction and self-wavelength stabilization is proposed for long-stroke micro/nano positioning stage metrology. In this interferometer, the displacement measurement is based on
Externí odkaz:
https://doaj.org/article/6f05cbefde0d49869c028b275b046164
Publikováno v:
Sensors, Vol 19, Iss 18, p 3833 (2019)
A robust laser measurement system (LMS), consisting of a sensor head and a detecting part, for simultaneously measuring five-degree-of-freedom (five-DOF) error motions of linear stages, is proposed and characterized. For the purpose of long-travel me
Externí odkaz:
https://doaj.org/article/fad69285ed824462a93977ac5a8c11a1
Publikováno v:
Journal of Advanced Mechanical Design, Systems, and Manufacturing, Vol 10, Iss 5, Pp JAMDSM0080-JAMDSM0080 (2016)
This paper presents a design study of an optical configuration for the fabrication of a two-dimensional grating, which will be used as a scale in a planar encoder system. For the modified two-axis Lloyd's mirror interferometer, in which major modific
Externí odkaz:
https://doaj.org/article/aec40025501b4f208312861332271c06
Publikováno v:
Applied Sciences, Vol 8, Iss 11, p 2209 (2018)
This paper presents a miniature three-degree-of-freedom laser measurement (3DOFLM) system for displacement feedback and error compensation of a nanopositioning stage. The 3DOFLM system is composed of a miniature Michelson interferometer (MMI) kit, a
Externí odkaz:
https://doaj.org/article/4e1fbad68b1648d3b084192ad1330dcf
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 72:1-11