Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Yih-cheng Wei"'
Autor:
Magdalena Ruiz, LingXiang Liu, H. Fujiki, A.Y.K. Yan, Hitoshi Sasaki, A. Charoensook, Bambang Suprianto, I. Budovsky, Yih-cheng Wei, M.D. Early, S.P.B. Leones, M. Klonz, M. Temba, A.R.B.Z. Abidin, A.K. Govil, N.A. Son, C. Kumtawee, Sung-Won Kwon, V.K. Rustagi
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 54:795-798
This paper presents preliminary results of the APMP.EM-K6a key comparison of AC-DC transfer conducted during 2000 to 2003. The AC-DC voltage transfer difference of the travelling standard was measured at 3 V and selected frequencies from 1 kHz to 1 M
Autor:
Ilya Budovsky, Abdul Bin Zainal Abidin, Y.k. Yan, Liu Lingxiang, V.K. Rustagi, A.K. Govil, Manfred Klonz, Yih-cheng Wei, Murray Early, Hitoshi Sasaki, Hiroyuki Fujiki, Chalit Kumtawee, Sung-won Kwon, Nguyen Son, Bumbang Suprianto, Moses Temba, Manuel Ruiz, Sabino B. Leones
Publikováno v:
2004 Conference on Precision Electromagnetic Measurements.
Autor:
Yih-Cheng Wei, Hsiu-Ju Tsai
Publikováno v:
IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309).
Many electrical standard laboratories use /spl mu/pots as the primary standards for low ac voltage measurement. To determine the ac-dc difference of a /spl mu/pot usually requires a transfer standard which has high input impedance for the standard va
Autor:
Yih-Cheng Wei, Hsin-Da Yeh
Publikováno v:
Metrologia. 47:01016-01016
The international key comparison APMP.EM-K9 of AC–DC high voltage transfer standards with 12 participants was carried out from June 2000 to January 2004. This comparison offers the same range and frequencies as BIPM key comparison CCEM-K9, voltages
Autor:
Budovsky, I., Abdul Rashid Bin Zainal Abidin, Yan, Y.K., Liu Lingxiang, Rustagi, V.K., Govil, A.K., Klonz, M., Yih-cheng Wei, Early, M., Hitoshi Sasaki, Hiroyuki Fujiki, Chalit Kumtawee, Sung-Won Kwon, Nguyen Anh Son, Suprianto, B., Temba, M., Ruiz, M., Leones, S.P.B.
Publikováno v:
2004 Conference on Precision Electromagnetic Measurements; 2004, p250-251, 2p
Conference
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Autor:
Yih-Cheng Wei, Hsiu-Ju Tsai
Publikováno v:
IMTC/99 Proceedings of the 16th IEEE Instrumentation & Measurement Technology Conference (Cat No99CH36309); 1999, Issue 3, p1834-1834, 1p