Zobrazeno 1 - 10
of 215
pro vyhledávání: '"Yier Jin"'
Autor:
Yang Li, Yanlei Kong, Mark H. Ebell, Leonardo Martinez, Xinyan Cai, Robert P. Lennon, Derjung M. Tarn, Arch G. Mainous, Aleksandra E. Zgierska, Bruce Barrett, Wen-Jan Tuan, Kevin Maloy, Munish Goyal, Alex H. Krist, Tamas S. Gal, Meng-Hsuan Sung, Changwei Li, Yier Jin, Ye Shen
Publikováno v:
Frontiers in Medicine, Vol 9 (2022)
ObjectivesAn accurate prognostic score to predict mortality for adults with COVID-19 infection is needed to understand who would benefit most from hospitalizations and more intensive support and care. We aimed to develop and validate a two-step score
Externí odkaz:
https://doaj.org/article/a55ce05cea374954872b126ca21103bb
Autor:
Ali Sayghe, Yaodan Hu, Ioannis Zografopoulos, XiaoRui Liu, Raj Gautam Dutta, Yier Jin, Charalambos Konstantinou
Publikováno v:
IET Smart Grid (2020)
Over the last decade, the number of cyber attacks targeting power systems and causing physical and economic damages has increased rapidly. Among them, false data injection attacks (FDIAs) are a class of cyber-attacks against power grid monitoring sys
Externí odkaz:
https://doaj.org/article/3f6b7f560d0243d1aa1f5935ba4a25a9
Publikováno v:
Micromachines, Vol 12, Iss 8, p 898 (2021)
Dynamic information flow tracking (DIFT) has been proven an effective technique to track data usage; prevent control data attacks and non-control data attacks at runtime; and analyze program performance. Therefore, a series of DIFT techniques have be
Externí odkaz:
https://doaj.org/article/804b9b1890f74a858d03df3f1a52dcc6
Publikováno v:
IEEE Transactions on Information Forensics and Security. 18:1365-1379
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4aacae40cfb525d4341ebb102f3cded4
https://doi.org/10.1109/tifs.2023.3239184
https://doi.org/10.1109/tifs.2023.3239184
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42:68-81
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa816e26949d065217f5376761e02779
https://doi.org/10.1109/tcad.2022.3174171
https://doi.org/10.1109/tcad.2022.3174171
Publikováno v:
IEEE Transactions on Emerging Topics in Computing. :1-14
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c14ac1140a3b3fa02b936529b7f7a62a
https://doi.org/10.1109/tetc.2023.3257826
https://doi.org/10.1109/tetc.2023.3257826
Autor:
Peng Chen, Cheng-Xin Xue, Yier Jin, Yi-Chun Shih, Chieh-Pu Lo, Chun-Ying Lee, Je-Min Hung, Hsiao-Yu Huang, Ssu-Yen Wu, Meng-Fan Chang, Yu-Der Chih, Shih-Hsih Teng, Tsung-Yung Jonathan Chang, Kuang-Tang Chang, Hui-Yao Kao, Yen-Cheng Chiu, Tung-Cheng Chang
Publikováno v:
IEEE Journal of Solid-State Circuits. 57:1936-1949
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d1f28e76a6523b9097699109c8cda7a
https://doi.org/10.1109/jssc.2021.3112182
https://doi.org/10.1109/jssc.2021.3112182
Dual-Leak: Deep Unsupervised Active Learning for Cross-Device Profiled Side-Channel Leakage Analysis
Publikováno v:
2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d733c6a1c94e2fec5d2252ba27aa466a
https://doi.org/10.1109/host55118.2023.10133491
https://doi.org/10.1109/host55118.2023.10133491
Publikováno v:
2023 24th International Symposium on Quality Electronic Design (ISQED).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::371b5b3d0fba3a5b25b3840616a74b80
https://doi.org/10.1109/isqed57927.2023.10129374
https://doi.org/10.1109/isqed57927.2023.10129374
Publikováno v:
ACM Journal on Emerging Technologies in Computing Systems. 18:1-20
Side Channel Analysis (SCA) presents a clear threat to privacy and security in modern computing systems. The vast majority of communications are secured through cryptographic algorithms. These algorithms are often provably-secure from a cryptographic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aefd6d8b5a76cc95f7d2c39c504fb4ce
https://doi.org/10.1145/3517810
https://doi.org/10.1145/3517810